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1. WO2004102601 - SOUDEUSE DE NANOZONE ET METHODE ASSOCIEE

Note: Texte fondé sur des processus automatiques de reconnaissance optique de caractères. Seule la version PDF a une valeur juridique

[ EN ]

WHAT IS CLAIMED IS:
1. An apparatus comprising:
an electron beam source positioned a distance from a work piece to be welded; and
a power supply for causing a beam of elections to emit from the election beam source towards the work piece causing local heating at a desired spot on the work piece to thereby create a weld joint on the work piece.

2. The apparatus as recited in claim 1, wherein the electron beam source is a scanning probe microscope.

3. The apparatus as recited in claim 1, wherein the election beam source is an AFM microtip probe.

4. The apparatus as recited in claim 1, wherein the electron beam source is a STM microtip probe.

5. The apparatus as recited in claim 1, wherein the election beam source is a hopping electron cathode.

6. An apparatus comprising:
a printed circuit board supporting a plurality of electron beam sources; and
circuitry for activating the plurality of electron beam sources to each emit an election beam to create a plurality of weld joints on a work piece positioned a distance from the printed circuit board.

7. The apparatus as recited in claim 6, wherein the election beam source is a scanning probe microscope.

8. The apparatus as recited in claim 6, wherein the electron beam source is an AFM microtip probe.

9. The apparatus as recited in claim 6, wherein the election beam source is a STM microtip probe.

10. The apparatus as recited in claim 6, wherein the electron beam source is a hopping electron cathode.

11. The apparatus as recited in claim 6, wherein the work piece is movable relative to the printed circuit board.

12. The apparatus as recited in claim 6, wherein the plurality of election beam sources are activated in parallel

13. The apparatus as recited in claim 6, wherein the plurality of electron beam sources are arranged in an array on the printed circuit board.

14. A method for creating a weld joint comprising the steps of:
positioning an electron beam source a distance from a work piece; and
activating the electron beam source to emit an electron beam to a spot on the work piece to create the weld joint at the spot on the work piece.

15. The apparatus as recited in claim 14, wherein the electron beam source is a scanning probe microscope.

16. The apparatus as recited in claim 14, wherein the electron beam source is an AFM microtip probe.

17. The apparatus as recited in claim 14, wherein the electron beam source is a STM microtip probe.

18. The apparatus as recited in claim 14, wherein the election beam source is a hopping electron cathode.

19. An apparatus as recited in claim 18, wherein the electron source is separated from the work piece by the HEC funnel array and additional chamber walls.