Traitement en cours

Veuillez attendre...

Paramétrages

Paramétrages

Aller à Demande

1. US20120330581 - POTENTIAL OBTAINING APPARATUS, MAGNETIC FIELD MICROSCOPE, INSPECTION APPARATUS, AND POTENTIAL OBTAINING METHOD

Office
États-Unis d'Amérique
Numéro de la demande 13582151
Date de la demande 01.03.2011
Numéro de publication 20120330581
Date de publication 27.12.2012
Type de publication A1
CIB
G06F 19/00
GPHYSIQUE
06CALCUL; COMPTAGE
FTRAITEMENT ÉLECTRIQUE DE DONNÉES NUMÉRIQUES
19Équipement ou méthodes de traitement de données ou de calcul numérique, spécialement adaptés à des applications spécifiques
CPC
G01R 33/10
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
02Measuring direction or magnitude of magnetic fields or magnetic flux
10Plotting field distribution ; ; Measuring field distribution
G01N 24/08
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
24Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
08by using nuclear magnetic resonance
G01R 33/3808
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
20involving magnetic resonance
28Details of apparatus provided for in groups G01R33/44 - G01R33/64
38Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field
3808Magnet assemblies for single-sided MR wherein the magnet assembly is located on one side of a subject only; Magnet assemblies for inside-out MR, e.g. for MR in a borehole or in a blood vessel, or magnet assemblies for fringe-field MR
Déposants Kimura Kenjiro
Inventeurs Kimura Kenjiro
Données relatives à la priorité 2010-044218 01.03.2010 JP
Titre
(EN) POTENTIAL OBTAINING APPARATUS, MAGNETIC FIELD MICROSCOPE, INSPECTION APPARATUS, AND POTENTIAL OBTAINING METHOD
Abrégé
(EN)

In a magnetic field obtaining apparatus, a measuring part (21) that is sufficiently longer than the width of an area to be measured is disposed on a measurement plane that satisfies z=α, and scanning in an X′ direction perpendicular to the longitudinal direction of the measuring part (21) is repeated while changing an angle θ formed by a predetermined reference direction on the measurement plane and the longitudinal direction of the measuring part (21) to a plurality of angles. Assuming that x′ is a coordinate parameter in the X′ direction, measured values f(x′, θ) obtained by repetitions of the scanning are Fourier transformed so as to obtain g(kx′, θ) (where kx′ is a wavenumber in the X′ direction). Then, g(kx′, θ) is substituted into a predetermined two-dimensional potential obtaining equation so as to obtain φ(x, y, α) that indicates a two-dimensional potential on the measurement plane. Accordingly, it is possible to perform high-resolution two-dimensional potential measurement as a result of using the measuring part (21) that is sufficiently larger than the width of an area to be measured.


Documents de brevet associés