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1. US20070201039 - Method for optical characterization and evaluation of optically variable devices and media

Office États-Unis d'Amérique
Numéro de la demande 11678918
Date de la demande 26.02.2007
Numéro de publication 20070201039
Date de publication 30.08.2007
Numéro de délivrance 7719675
Date de délivrance 18.05.2010
Type de publication B2
CIB
G01J 3/00
GPHYSIQUE
01MÉTROLOGIE; TESTS
JMESURE DE L'INTENSITÉ, DE LA VITESSE, DU SPECTRE, DE LA POLARISATION, DE LA PHASE OU DES CARACTÉRISTIQUES D'IMPULSIONS DE LUMIÈRE INFRAROUGE, VISIBLE OU ULTRAVIOLETTE; COLORIMÉTRIE; PYROMÉTRIE DES RADIATIONS
3Spectrométrie; Spectrophotométrie; Monochromateurs; Mesure de la couleur
G01N 21/17
GPHYSIQUE
01MÉTROLOGIE; TESTS
NRECHERCHE OU ANALYSE DES MATÉRIAUX PAR DÉTERMINATION DE LEURS PROPRIÉTÉS CHIMIQUES OU PHYSIQUES
21Recherche ou analyse des matériaux par l'utilisation de moyens optiques, c. à d. en utilisant des rayons infrarouges, visibles ou ultraviolets
17Systèmes dans lesquels la lumière incidente est modifiée suivant les propriétés du matériau examiné
CPC
G03H 1/22
GPHYSICS
03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
HHOLOGRAPHIC PROCESSES OR APPARATUS
1Holographic processes or apparatus using light, infra-red or ultra-violet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
22Processes or apparatus for obtaining an optical image from holograms
G01N 21/958
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
95characterised by the material or shape of the object to be examined
958Inspecting transparent materials ; or objects, e.g. windscreens
G03H 2001/2247
GPHYSICS
03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
HHOLOGRAPHIC PROCESSES OR APPARATUS
1Holographic processes or apparatus using light, infra-red or ultra-violet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
22Processes or apparatus for obtaining an optical image from holograms
2202Reconstruction geometries or arrangements
2244Means for detecting or recording the holobject
2247for testing the hologram or holobject
G07D 7/12
GPHYSICS
07CHECKING-DEVICES
DHANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
7Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency
06using wave or particle radiation
12Visible light, infra-red or ultraviolet radiation
G07D 7/121
GPHYSICS
07CHECKING-DEVICES
DHANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
7Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency
06using wave or particle radiation
12Visible light, infra-red or ultraviolet radiation
121Apparatus characterised by sensor details
Déposants Applied Extrusion Technologies, Inc.
Inventeurs Grygier Robert K.
Wieloch Kelan
Mandataires Caesar, Rivise, Bernstein, Cohen &; Pokotilow, Ltd.
Données relatives à la priorité 11678918 26.02.2007 US
Titre
(EN) Method for optical characterization and evaluation of optically variable devices and media
Abrégé
(EN)

Methods for evaluating an optically variable device (“OVD”) or optically variable media (“OVM”) are disclosed. The methods include the steps of applying light of a single wavelength from a calibrated light source to the OVD or OVM; measuring the light diffracted by the OVD or OVM with an integrating sphere; measuring the total incident light on the OVD or OVM; and calculating a diffraction efficiency for the OVD or OVM at the single wavelength based on the measurement of light diffracted and the measurement of total incident light.

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