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1. CN109765206 - Method for representing defect of two-dimensional material and application thereof

Office
Chine
Numéro de la demande 201910101478.6
Date de la demande 31.01.2019
Numéro de publication 109765206
Date de publication 17.05.2019
Numéro de délivrance 109765206
Date de délivrance 24.11.2020
Type de publication B
CIB
G01N 21/64
GPHYSIQUE
01MÉTROLOGIE; TESTS
NRECHERCHE OU ANALYSE DES MATÉRIAUX PAR DÉTERMINATION DE LEURS PROPRIÉTÉS CHIMIQUES OU PHYSIQUES
21Recherche ou analyse des matériaux par l'utilisation de moyens optiques, c. à d. en utilisant des rayons infrarouges, visibles ou ultraviolets
62Systèmes dans lesquels le matériau analysé est excité de façon à ce qu'il émette de la lumière ou qu'il produise un changement de la longueur d'onde de la lumière incidente
63excité optiquement
64Fluorescence; Phosphorescence
CPC
G01N 21/64
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63optically excited
64Fluorescence; Phosphorescence
Déposants TSINGHUA UNIVERSITY
清华大学
Inventeurs LIU DAMENG
刘大猛
LIU HUAN
刘欢
WANG TING
王婷
LUO JIANBIN
雒建斌
Mandataires 北京路浩知识产权代理有限公司 11002
Titre
(EN) Method for representing defect of two-dimensional material and application thereof
(ZH) 表征二维材料缺陷的方法及其应用
Abrégé
(EN)
The invention discloses a method for representing a defect of a two-dimensional material and application thereof, and relates to the technical field of defect representation of a nanomaterial. The method for representing the defect comprises the step of: respectively and independently carrying out fluorescence lifetime imaging on a non-defect two-dimensional material substrate sample and a to-be-detected two-dimensional material substrate sample, and according to the change of a fluorescence lifetime, judging whether the to-be-detected two-dimensional material substrate sample has a defect, i.e., if the fluorescence lifetime of the to-be-detected two-dimensional material substrate sample is longer than that of the non-defect two-dimensional material substrate sample, determining that the to-be-detected two-dimensional material substrate sample is a defect sample, and if the fluorescence lifetime of the to-be-detected two-dimensional material substrate sample has no obvious change withrespect to the fluorescence lifetime of the non-defect two-dimensional material substrate sample, determining that the to-be-detected two-dimensional material substrate sample is a non-defect sample.The method disclosed by the invention adopts a fluorescence lifetime imaging method to represent the defect of the two-dimensional material; by the method, the change of the fluorescence lifetime canbe rapidly and visually observed so as to judge whether the material has the defect; and at the room temperature, representation can be carried out, a new defect cannot be introduced, and the method is a non-destructive detection method.

(ZH)
本发明公开了一种表征二维材料缺陷的方法及其应用,涉及纳米材料缺陷表征技术领域。表征缺陷的方法包括:分别独立地对无缺陷的二维材料衬底样品和待测二维材料衬底样品进行荧光寿命成像,根据荧光寿命的变化判断有无缺陷:如果待测二维材料衬底样品的荧光寿命高于无缺陷的二维材料衬底样品的荧光寿命,则待测二维材料衬底样品为有缺陷样品;如果待测二维材料衬底样品的荧光寿命与无缺陷的二维材料衬底样品的荧光寿命相比无明显变化,则待测二维材料衬底样品为无缺陷样品。本发明采用荧光寿命成像方法表征二维材料缺陷,该方法能够快速、直观地观察荧光寿命变化,从而判断材料有无缺陷,在室温下即可表征,不会引入新的缺陷,是一种无损检测方法。

Related patent documents
GB2111896.3This application is not viewable in PATENTSCOPE because the national phase entry has not been published yet or the national entry is issued from a country that does not share data with WIPO or there is a formatting issue or an unavailability of the application.