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1. (WO2008133235) TWO-DIMENSIONAL PATTERN MATCHING METHOD, FEATURE EXTRACTION METHOD, AND DEVICE AND PROGRAM USED FOR THESE METHODS

Pub. No.:    WO/2008/133235    International Application No.:    PCT/JP2008/057689
Publication Date: Fri Nov 07 00:59:59 CET 2008 International Filing Date: Tue Apr 22 01:59:59 CEST 2008
IPC: G06T 7/00
Applicants: NEC CORPORATION
日本電気株式会社
KAMEI, Toshio
亀井 俊男
Inventors: KAMEI, Toshio
亀井 俊男
Title: TWO-DIMENSIONAL PATTERN MATCHING METHOD, FEATURE EXTRACTION METHOD, AND DEVICE AND PROGRAM USED FOR THESE METHODS
Abstract:
A two-dimensional pattern matching method includes a step of extracting reference feature data by projecting the vector expression of either an input reference two-dimensional pattern or a converted reference two-dimensional pattern to a feature space, the converted reference two-dimensional pattern being generated by converting the input reference two-dimensional pattern. A pre-registered registered feature data and the reference feature data are back-projected to a two-dimensional pattern expression space having the dimension of the vector expression to calculate the degree of similarity. This provides a matching technique having a small data size of the feature amount and robust to displacement and image distortion.