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1. (WO2019048504) MICROSCOPE HAVING COLLISION PROTECTION
국제사무국에 기록된 최신 서지정보    정보 제출

공개번호: WO/2019/048504 국제출원번호: PCT/EP2018/073910
공개일: 14.03.2019 국제출원일: 05.09.2018
IPC:
G02B 21/02 (2006.01) ,G02B 21/24 (2006.01) ,G02B 21/26 (2006.01)
G SECTION G — 물리학
02
광학
B
광학요소, 광학계 또는 광학장치; H01J; X선 광학 H01J; 29/89
21
현미경
02
대물렌즈
G SECTION G — 물리학
02
광학
B
광학요소, 광학계 또는 광학장치; H01J; X선 광학 H01J; 29/89
21
현미경
24
가대구조
G SECTION G — 물리학
02
광학
B
광학요소, 광학계 또는 광학장치; H01J; X선 광학 H01J; 29/89
21
현미경
24
가대구조
26
재물대; 그것을 위한 조절장치
출원인:
LEICA MICROSYSTEMS CMS GMBH [DE/DE]; Ernst-Leitz-Str. 17-37 35578 Wetzlar, DE
발명자:
HITZLER, Sebastian; DE
대리인:
GRUNERT, Marcus; KUDLEK & GRUNERT PATENTANWÄLTE Postfach 33 04 29 80064 München, DE
우선권 정보:
10 2017 120 651.507.09.2017DE
발명의 명칭: (EN) MICROSCOPE HAVING COLLISION PROTECTION
(FR) MICROSCOPE DOTÉ D’UNE PROTECTION ANTI-COLLISION
(DE) MIKROSKOP MIT KOLLISIONSSCHUTZ
요약서:
(EN) The invention relates to a microscope, comprising a stand (20), on which a microscope stage (40) for supporting a preparation (41) and an objective (30) are arranged, and comprising a positioning system (21) for setting a distance between the microscope stage (40) and the objective (30) and/or for setting an X-Y-position of the microscope stage, the microscope (10) having a force or pressure sensor (32, 42), which is arranged and designed in such a way that a transmission of force from the microscope stage (40) to the objective (30) or vice versa is detected.
(FR) L’invention concerne un microscope comprenant : un pied (20) sur lequel sont montés une table de microscope (40) destiné à porter une préparation (41), et un objectif (30); un système de positionnement (21) servant à régler la distance entre la table de microscope (40) et l’objectif (30) et/ou à régler la position X-Y de la table de microscope (40), le microscope (10) présentant un capteur de force ou de pression (32, 42) qui est disposé et conçu de telle sorte qu'une transmission de force de la table de microscope (40) à l'objectif (30) ou inversement est détectée.
(DE) Die Erfindung betrifft ein Mikroskop mit einem Stativ (20), an dem ein Mikroskoptisch (40) zum Tragen eines Präparats (41) und ein Objektiv (30) angeordnet sind, und mit einem Positioniersystem (21) zur Einstellung eines Abstandes zwischen dem Mikroskoptisch (40) und dem Objektiv (30) und/oder zur Einstellung einer X-Y-Position des Mikroskoptisches, wobei das Mikroskop (10) einen Kraft- oder Drucksensor (32, 42) aufweist, der derart angeordnet und eingerichtet ist, dass eine Kraftübertragung von dem Mikroskoptisch (40) auf das Objektiv (30) oder umgekehrt erkannt wird.
front page image
지정국: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
아프리카지역 지식재산권기구(ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
유라시아 특허청 (AM, AZ, BY, KG, KZ, RU, TJ, TM)
유럽 특허청(EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
공개언어: 독일어 (DE)
출원언어: 독일어 (DE)