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1. (WO2019042036) THREE-DIMENSIONAL MEMORY DEVICES AND FABRICATING METHODS THEREOF
국제사무국에 기록된 최신 서지정보정보 제출

공개번호: WO/2019/042036 국제출원번호: PCT/CN2018/096103
공개일: 07.03.2019 국제출원일: 18.07.2018
IPC:
H01L 27/11551 (2017.01)
[IPC code unknown for ERROR IPC Code incorrect: invalid subgroup (0=>999999)!]
출원인:
YANGTZE MEMORY TECHNOLOGIES CO., LTD. [CN/CN]; Room 7018, No.18, Huaguang Road, Guandong Science and Technology Industrial Park East Lake High-Tech Development Zone Wuhan, Hubei 430074, CN
발명자:
ZHOU, Cheng; CN
YUAN, Bin; CN
LIU, Qingbo; CN
XU, Songman; CN
LIU, Siying; CN
GONG, Rui; CN
ZHAO, Zhiguo; CN
TANG, Zhaoyun; CN
XIA, Zhiliang; CN
HUO, Zongliang; CN
대리인:
NTD UNIVATION INTELLECTUAL PROPERTY AGENCY LTD.; 10th Floor, Tower C, Beijing Global Trade Center 36 North Third Ring Road East, Dongcheng District Beijing 100013, CN
우선권 정보:
201710770822.131.08.2017CN
발명의 명칭: (EN) THREE-DIMENSIONAL MEMORY DEVICES AND FABRICATING METHODS THEREOF
(FR) DISPOSITIFS DE MÉMOIRE TRIDIMENSIONNELS ET LEURS PROCÉDÉS DE FABRICATION
요약서:
(EN) A method for forming a 3D memory device is disclosed. The method includes: forming an first insulating layer (114) on a substrate (100) in a peripheral region (110), the first insulating layer (114) having a slope near a boundary between the peripheral region (110) and a core region (120) of the substrate (100); forming an alternating conductive/dielectric stack (250) on the substrate (100) and the slope of the first insulating layer (114), a lateral portion of the alternating conductive/dielectric stack (250) extending along a top surface of the substrate (100) in the core region (120), and an inclined portion of the alternating conductive/dielectric stack (250) extending along the slope of the first insulating layer (114); and forming a plurality of contacts (310) to electrically contact a plurality of conductive layers in the inclined portion of the alternating conductive/dielectric stack (250).
(FR) L'invention concerne un procédé de formation d'un dispositif de mémoire 3D. Le procédé consiste : à former une première couche isolante (114) sur un substrat (100) dans une région périphérique (110), la première couche isolante (114) ayant une pente proche d'une limite entre la région périphérique (110) et une région centrale (120) du substrat (100) ; à former un empilement conducteur/diélectrique alternatif (250) sur le substrat (100) et la pente de la première couche isolante (114), une partie latérale de l'empilement diélectrique/diélectrique alternatif (250) s'étendant le long d'une surface supérieure du substrat (100) dans la région centrale (120), et une partie inclinée de l'empilement conducteur/diélectrique alternatif (250) s'étendant le long de la pente de la première couche isolante (114) ; et à former une pluralité de contacts (310) destinés à entrer en contact électrique avec une pluralité de couches conductrices dans la partie inclinée de l'empilement conducteur/diélectrique alternatif (250).
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지정국: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
아프리카지역 지식재산권기구(ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
유라시아 특허청(EAPO) (AM, AZ, BY, KG, KZ, RU, TJ, TM)
유럽 특허청(EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
아프리카 지식재산권기구(OAPI) (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
공개언어: 영어 (EN)
출원언어: 영어 (EN)