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1. (WO2019030522) LASER PROCESSING
국제사무국에 기록된 최신 서지정보    정보 제출

공개번호: WO/2019/030522 국제출원번호: PCT/GB2018/052258
공개일: 14.02.2019 국제출원일: 08.08.2018
IPC:
출원인:
RENISHAW PLC [GB/GB]; New Mills Wotton-under-Edge Gloucestershire GL12 8JR, GB
발명자:
THOMSON, Ian, James; GB
대리인:
MATTHEWS, Paul; GB
DUNN, Paul; GB
ROLFE, Edward; GB
BREWER, Michael; GB
우선권 정보:
1712739.009.08.2017GB
발명의 명칭: (EN) LASER PROCESSING
(FR) TRAITEMENT AU LASER
요약서:
(EN) This invention concerns a method of laser processing comprising generating a laser beam (118) having, at different longitudinal positions in a propagation direction, first and second transverse beam profiles of energy density. The first transverse beam profile is different to the second transverse beam profile and is non-Gaussian. The method comprises carrying out a scan of the laser beam (118) across a working surface (104a), wherein, during the scan, the laser beam (118) and/or working surface (104a) is adjusted such that, for a first part of the scan, the first transverse beam profile is located at the working surface (104a) and, for a second part of the scan, the second transverse beam profile is located at the working surface (104a).
(FR) La présente invention concerne un procédé de traitement au laser consistant à générer un faisceau laser (118) ayant, à différents emplacements longitudinaux dans une direction de propagation, des premier et second profils de faisceau transversal de densité d'énergie. Le premier profil de faisceau transversal est différent du second profil de faisceau transversal et est non gaussien. Le procédé consiste à effectuer un balayage du faisceau laser (118) sur une surface de travail (104a). Au cours du balayage, le faisceau laser (118) et/ou la surface de travail (104a) sont réglés de telle sorte que, pour une première partie du balayage, le premier profil de faisceau transversal est situé au niveau de la surface de travail (104a) et, pour une seconde partie du balayage, le second profil de faisceau transversal est situé au niveau de la surface de travail (104a).
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지정국: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
아프리카지역 지식재산권기구(ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
유라시아 특허청 (AM, AZ, BY, KG, KZ, RU, TJ, TM)
유럽 특허청(EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
공개언어: 영어 (EN)
출원언어: 영어 (EN)