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1. (WO2011020598) TEST STRIP WITH A SHAPED TIP FOR SKIN STRAIGHTENING
국제사무국에 기록된 최신 서지정보

공개번호: WO/2011/020598 국제출원번호: PCT/EP2010/005057
공개일: 24.02.2011 국제출원일: 18.08.2010
IPC:
B01L 3/00 (2006.01) ,A61B 5/151 (2006.01)
B SECTION B — 처리조작; 운수
01
물리적 방법, 화학적 방법 또는 장치일반
L
일반적으로 사용되는 화학 또는 물리 실험장치
3
실험용 용기 또는 접시, 예. 실험용글라스기구; 점적기
A SECTION A — 생활필수품 농업
61
위생학; 의학 또는 수의학
B
진단; 수술; 개인 식별
5
진단을 위한 측정; 개인식별
15
혈액시료를 채취하기 위한 용구
151
모세관혈의 샘플 채취에 특별히 적합한 것, 예.란셋에 의한 것
출원인:
ROCHE DIAGNOSTICS GMBH [DE/DE]; Sandhofer Strasse 116 68305 Mannheim, DE (DE)
F. HOFFMANN-LA ROCHE AG [CH/CH]; Grenzacherstrasse 124 CH-4070 Basel, CH (AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BE, BF, BG, BH, BJ, BR, BW, BY, BZ, CA, CF, CG, CH, CI, CL, CM, CN, CO, CR, CU, CY, CZ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, FR, GA, GB, GD, GE, GH, GM, GN, GQ, GR, GT, GW, HN, HR, HU, ID, IE, IL, IN, IS, IT, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MC, MD, ME, MG, MK, ML, MN, MR, MT, MW, MX, MY, MZ, NA, NE, NG, NI, NL, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SI, SK, SL, SM, SN, ST, SV, SY, SZ, TD, TG, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, UZ, VC, VN, ZA, ZM, ZW)
발명자:
KEIL, Michael; DE
일반
대표자:
ROCHE DIAGNOSTICS GMBH [DE/DE]; Patent Department 68298 Mannheim, DE
우선권 정보:
12/544,29620.08.2009US
발명의 명칭: (EN) TEST STRIP WITH A SHAPED TIP FOR SKIN STRAIGHTENING
(FR) BANDELETTE RÉACTIVE DOTÉE D'UNE POINTE PROFILÉE POUR TENDRE LA PEAU
요약서:
(EN) The test strip stabilizes skin prior to incision by a lancet tip. The innovative test strip includes a pair of skin contacting tabs that apply pressure linearly to the skin to stretch the skin taut. Beneficially an incision by a lancet tip to an accurate depth can be formed on the taut skin. Moreover, pressure from the tabs is applied linearly to the skin which results in a higher ratio of pressure to surface that can be reached as compared to applying pressure laminarily to skin. Some manufacturing techniques of the skin contacting tabs include cutting or stamping through all of the layers and test area of the test strip to form these tabs. These techniques increase the manufacturing efficiency and cost savings associated with test strips and integrated lancet testing devices. Contamination from other sampling events is eliminated since the test strips are disposed of after each use.
(FR) L'invention concerne une bandelette réactive stabilisant la peau avant de pratiquer une incision à l'aide d'une pointe de lancette. La bandelette réactive innovante comprend une paire de languettes de contact cutané qui appliquent une pression linéairement par rapport à la peau en vue de la tendre. Une incision peut être avantageusement pratiquée à une profondeur précise à l'aide d'une pointe de lancette sur la peau tendue. De plus, la pression des languettes est appliquée de manière linéaire par rapport à la peau, ce qui permet donc d'atteindre un rapport supérieur de la pression à la surface par comparaison à l'application d'une pression de manière laminaire par rapport à la peau. Certaines techniques de fabrication des languettes de contact cutané comprennent le découpage ou l'estampage dans l'ensemble des couches et de la zone de test de la bandelette réactive pour former ces languettes. Ces techniques accroissent l'efficacité de fabrication et augmentent les économies associées aux bandelettes réactives et aux dispositifs de test avec lancettes intégrées. La contamination due à d'autres événements d'échantillonnage est éliminée car les bandelettes réactives sont jetées après chaque utilisation.
front page image
지정국: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
아프리카지역 지식재산권기구(ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
유라시아 특허청(EAPO) (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
유럽 특허청(EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
아프리카 지식재산권기구(OAPI) (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
공개언어: 영어 (EN)
출원언어: 영어 (EN)