이 애플리케이션의 일부 콘텐츠는 현재 사용할 수 없습니다.
이 상황이 계속되면 다음 주소로 문의하십시오피드백 및 연락
1. (WO2007031898) DIRECT MEASURING AND CORRECTION OF SCATTER FOR CT
국제사무국에 기록된 최신 서지정보

공개번호: WO/2007/031898 국제출원번호: PCT/IB2006/053054
공개일: 22.03.2007 국제출원일: 01.09.2006
IPC:
A61B 6/00 (2006.01)
A SECTION A — 생활필수품 농업
61
위생학; 의학 또는 수의학
B
진단; 수술; 개인 식별
6
방사선 진단용 기기, 예. 방사선치료와 결합하여 있는 장치
출원인:
PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH [DE/DE]; Lübeckertordamm 5 20099 Hamburg, DE (DE)
KONINKLIJKE PHILIPS ELECTRONICS N.V. [NL/NL]; Groenewoudseweg 1 NL-5621 BA Eindhoven, NL (AE, AG, AL, AM, AT, AU, AZ, BA, BB, BE, BF, BG, BJ, BR, BW, BY, BZ, CA, CF, CG, CH, CI, CM, CN, CO, CR, CU, CY, CZ, DK, DM, DZ, EC, EE, EG, ES, FI, FR, GA, GB, GD, GE, GH, GM, GN, GQ, GR, GW, HN, HR, HU, ID, IE, IL, IN, IS, IT, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MC, MD, MG, MK, ML, MN, MR, MW, MX, MY, MZ, NA, NE, NG, NI, NL, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SI, SK, SL, SM, SN, SV, SY, SZ, TD, TG, TJ, TM, TN, TR, TT, TZ, UA, UG, UZ, VC, VN, ZA, ZM, ZW)
PROKSA, Roland [DE/DE]; DE (UsOnly)
발명자:
PROKSA, Roland; DE
대리인:
VOLMER, Georg; Philips Intellectual Property & Standards GmbH Weisshausstr. 2 52066 Aachen, DE
우선권 정보:
05108406.913.09.2005EP
발명의 명칭: (EN) DIRECT MEASURING AND CORRECTION OF SCATTER FOR CT
(FR) MESURE ET CORRECTION DIRECTES DE DISPERSION POUR TOMOGRAPHIE PAR ORDINATEUR
요약서:
(EN) Cone-beam CT scanners with large detector arrays suffer from increased scatter radiation. This radiation may cause severe image artefacts. An examination apparatus is provided which directly measures the scatter radiation and uses this measurement for a correction of the contaminated image data. The measurement is performed by utilizing a 1- dimensional anti-scatter-grid and an X-ray tube with an electronic focal spot movement. Image data is detected at a first position of a focal spot and scatter data is detected at a second position of the focal spot. The image data is corrected on the basis of the scatter data.
(FR) Les scanners de tomographie par ordinateur (CT) à faisceau conique présentant des groupes élevés de détecteur sont soumis à une dispersion de rayonnement accrue. Ce rayonnement peut provoquer des artéfacts graves dans l'image. Selon un mode de réalisation de l'invention, un dispositif d'examen mesure directement le rayonnement dispersé et utilise cette mesure pour corriger les données d'image contaminées. Cette mesure peut être exécutée au moyen d'un réseau antidispersion unidimensionnel et d'un tube à rayons X pourvu d'un déplacement électronique de point focal.
front page image
지정국: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MD, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
아프리카지역 지식재산권기구(ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
유라시아 특허청(EAPO) (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
유럽 특허청(EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR)
아프리카 지식재산권기구(OAPI) (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
공개언어: 영어 (EN)
출원언어: 영어 (EN)