処理中

しばらくお待ちください...

設定

設定

出願の表示

1. WO2019044103 - 撮像素子、積層型撮像素子及び固体撮像装置

公開番号 WO/2019/044103
公開日 07.03.2019
国際出願番号 PCT/JP2018/022008
国際出願日 08.06.2018
IPC
H01L 27/146 2006.1
H電気
01基本的電気素子
L半導体装置,他に属さない電気的固体装置
271つの共通基板内または上に形成された複数の半導体構成部品または他の固体構成部品からなる装置
14赤外線,可視光,短波長の電磁波または粒子線輻射に感応する半導体構成部品で,これらの輻射線エネルギーを電気的エネルギーに変換するかこれらの輻射線によって電気的エネルギーを制御するかのどちらかに特に適用されるもの
144輻射線によって制御される装置
146固体撮像装置構造
H04N 5/374 2011.1
H電気
04電気通信技術
N画像通信,例.テレビジョン
5テレビジョン方式の細部
30光または類似信号から電気信号への変換
335固体撮像素子を用いるもの
369固体撮像素子の構造,固体撮像素子と関連する回路に特徴のあるもの
374アドレス型センサ,例.MOS型ないしはCMOS型センサ
H01L 27/30 2006.1
H電気
01基本的電気素子
L半導体装置,他に属さない電気的固体装置
271つの共通基板内または上に形成された複数の半導体構成部品または他の固体構成部品からなる装置
28能動部分として有機材料を用い,または能動部分として有機材料と他の材料との組み合わせを用いる構成部品を含むもの
30赤外線,可視光,短波長の電磁波,または粒子線輻射への感応に特に適用される構成部品を有するもの;輻射線エネルギーを電気的エネルギーに変換するか,またはこれらの輻射線によって電気的エネルギーを制御するかのどちらかに特に適用される構成部品を有するもの
CPC
H01L 27/146
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
14including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
144Devices controlled by radiation
146Imager structures
H01L 27/14603
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
14including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
144Devices controlled by radiation
146Imager structures
14601Structural or functional details thereof
14603Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
H01L 27/14612
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
14including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
144Devices controlled by radiation
146Imager structures
14601Structural or functional details thereof
14609Pixel-elements with integrated switching, control, storage or amplification elements
14612involving a transistor
H01L 27/1462
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
14including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
144Devices controlled by radiation
146Imager structures
14601Structural or functional details thereof
1462Coatings
H01L 27/14627
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
14including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
144Devices controlled by radiation
146Imager structures
14601Structural or functional details thereof
14625Optical elements or arrangements associated with the device
14627Microlenses
H01L 27/14638
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
14including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
144Devices controlled by radiation
146Imager structures
14601Structural or functional details thereof
14638Structures specially adapted for transferring the charges across the imager perpendicular to the imaging plane
出願人
  • ソニーセミコンダクタソリューションズ株式会社 SONY SEMICONDUCTOR SOLUTIONS CORPORATION [JP]/[JP]
発明者
  • 河合 信宏 KAWAI Nobuhiro
  • 富樫 秀晃 TOGASHI Hideaki
  • 古閑 史彦 KOGA Fumihiko
  • 山口 哲司 YAMAGUCHI Tetsuji
  • 平田 晋太郎 HIRATA Shintarou
  • 渡部 泰一郎 WATANABE Taiichiro
  • 安藤 良洋 ANDO Yoshihiro
代理人
  • 山本 孝久 YAMAMOTO Takahisa
  • 吉井 正明 YOSHII Masaaki
優先権情報
2017-16758631.08.2017JP
公開言語 (言語コード) 日本語 (ja)
出願言語 (言語コード) 日本語 (JA)
指定国 (国コード)
発明の名称
(EN) IMAGING ELEMENT, LAMINATED IMAGING ELEMENT, AND SOLID-STATE IMAGING DEVICE
(FR) ÉLÉMENT D'IMAGERIE, ÉLÉMENT D'IMAGERIE STRATIFIÉ ET DISPOSITIF D'IMAGERIE À SEMI-CONDUCTEUR
(JA) 撮像素子、積層型撮像素子及び固体撮像装置
要約
(EN) According to the present invention, a solid-state imaging element is provided with a pixel having: a first imaging element; a second imaging element; a third imaging element; and an on-chip micro-lens 90, wherein the first imaging element includes a first electrode 11, a third electrode 12, and a second electrode 16. The pixel is further provided with: a third electrode control line VOA that is connected to the third electrode 12; and a plurality of control lines 62B which are respectively connected to various transistors provided in the second imaging element and the third imaging element, and which are different from the third electrode control line VOA. In the pixel, the distance between the center of the on-chip micro-lens 90 provided to the pixel and one of the plurality of control lines 62B provided in the pixel is shorter than the distance between the center of the on-chip micro-lens 90 provided to the pixel and the third electrode control line VOA provided to the pixel.
(FR) Selon la présente invention, un élément d'imagerie à semi-conducteur comprend un pixel ayant : un premier élément d'imagerie ; un second élément d'imagerie ; un troisième élément d'imagerie ; et une microlentille sur puce 90, le premier élément d'imagerie comprenant une première électrode 11, une troisième électrode 12, et une seconde électrode 16. Le pixel comprend en outre : une troisième ligne de commande d'électrode VOA qui est connectée à la troisième électrode 12 ; et une pluralité de lignes de commande 62B qui sont respectivement connectées à divers transistors fournis dans le second élément d'imagerie et le troisième élément d'imagerie, et qui sont différentes de la troisième ligne de commande d'électrode VOA. Dans le pixel, la distance entre le centre de la micro-lentille sur puce 90 fournie au pixel et l'une de la pluralité de lignes de commande 62B fournie au pixel est plus courte que la distance entre le centre de la micro-lentille sur puce 90 fournie au pixel et la troisième ligne de commande d'électrode VOA fournie au pixel.
(JA) 固体撮像素子は、第1撮像素子と第2撮像素子と第3撮像素子とオンチップ・マイクロ・レンズ90とを備えた画素を有し、第1撮像素子は第1電極11と第3電極12と第2電極16とを備え、画素は、第3電極12に接続した第3電極制御線VOAと、第2撮像素子及び第3撮像素子に備えられた各種トランジスタのそれぞれに接続され、第3電極制御線VOAとは異なる複数本の制御線62Bとを更に備え、画素は、画素に備わるオンチップ・マイクロ・レンズ90の中心と、該画素に備わる前記複数本の制御線62Bのいずれかとの間の距離が、該画素に備わるオンチップ・マイクロ・レンズ90の中心と該画素に備わる前記第3電極制御線VOAとの間の距離よりも小さい。
国際事務局に記録されている最新の書誌情報