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1. (US20100219819) Apparatus and method of obtaining field by measurement

官庁 : アメリカ合衆国
出願番号: 12594050 出願日: 28.03.2008
公開番号: 20100219819 公開日: 02.09.2010
特許番号: 08536862 特許付与日: 17.09.2013
公報種別: B2
PCT 関連事項: 出願番号:PCTJP2008056137 ; 公開番号: クリックしてデータを表示
IPC:
G01R 33/02
G 物理学
01
測定;試験
R
電気的変量の測定;磁気的変量の測定
33
磁気的変量を測定する計器または装置
02
磁界または磁束の方向または大きさの測定
出願人: Kimura Kenjiro
Kyoto University
Kobayashi Kei
Yamada Hirofumi
Matsushige Kazumi
Horiuchi Takashi
Satoh Nobuo
Nakai Akifumi
発明者: Kimura Kenjiro
Kobayashi Kei
Yamada Hirofumi
Matsushige Kazumi
Horiuchi Takashi
Satoh Nobuo
Nakai Akifumi
代理人: Wenderoth, Lind & Ponack, L.L.P.
優先権情報: P2007-91856 30.03.2007 JP
発明の名称: (EN) Apparatus and method of obtaining field by measurement
要約: front page image
(EN)

Above a sample (9) having magnetic domains, a distribution of magnetic force in a measurement plane (91) is obtained as a magnetic force image using a MFM, an auxiliary magnetic force image is obtained by performing measurement in a measurement plane (92) away from the measurement plane (91) by a distance d, and a difference between them is divided by the distance d to obtain a magnetic force gradient image. The magnetic force image and the auxiliary magnetic force image are Fourier transformed and substituted into a three-dimensional field obtaining equation derived from a general solution of the Laplace equation, and the three-dimensional field indicating the magnetic force is obtained. A state of the magnetic domains at the surface (93) of the sample (9) can be obtained with high accuracy by obtaining the three-dimensional field.


また、:
KR1020090130369EP2141481JPWO2008123432JP4878063WO/2008/123432