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1. KR1020190108655 - 결함 검사 시스템 및 필름의 제조 장치

パーマリンク
官庁
大韓民国
出願番号 1020197027080
出願日 30.05.2014
公開番号 1020190108655
公開日 24.09.2019
公報種別 A
IPC
G01N 21/896
G物理学
01測定;試験
N材料の化学的または物理的性質の決定による材料の調査または分析
21光学的手段,すなわち,赤外線,可視光線または紫外線を使用することによる材料の調査または分析
84特殊な応用に特に適合したシステム
88きず,欠陥,または汚れの存在の調査
89動いている材料,例.紙・織物,の中の
892調査されるきず,欠陥,または対象物の特質に特徴付けられるもの
896透明材料の内部または表面の光学的欠陥,例.歪・表面のきず
B32B 27/08
B処理操作;運輸
32積層体
B積層体,すなわち平らなまたは平らでない形状,例.細胞状またはハニカム状,の層から組立てられた製品
27本質的に合成樹脂からなる積層体
06層の主なまたは唯一の構成要素が上記の物質であり,特定物質の他の層に隣接したもの
08異なった種類の合成樹脂の層に隣接したもの
B32B 41/00
B処理操作;運輸
32積層体
B積層体,すなわち平らなまたは平らでない形状,例.細胞状またはハニカム状,の層から組立てられた製品
41積層過程の,監視または制御のための装置;安全装置
G01N 21/84
G物理学
01測定;試験
N材料の化学的または物理的性質の決定による材料の調査または分析
21光学的手段,すなわち,赤外線,可視光線または紫外線を使用することによる材料の調査または分析
84特殊な応用に特に適合したシステム
CPC
G01N 21/896
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
89in moving material, e.g. running paper or textiles
892characterised by the flaw, defect or object feature examined
896Optical defects in or on transparent materials, e.g. distortion, surface flaws ; in conveyed flat sheet or rod
B32B 27/08
BPERFORMING OPERATIONS; TRANSPORTING
32LAYERED PRODUCTS
BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
27Layered products comprising ; a layer of; synthetic resin
06as the main or only constituent of a layer, ; which is; next to another layer of ; the same or of; a ; different material
08of synthetic resin
B32B 41/00
BPERFORMING OPERATIONS; TRANSPORTING
32LAYERED PRODUCTS
BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
41Arrangements for controlling or monitoring lamination processes; Safety arrangements
G01N 21/8422
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
8422Investigating thin films, e.g. matrix isolation method
G01N 21/8901
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
89in moving material, e.g. running paper or textiles
8901Optical details; Scanning details
G01N 21/8914
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
89in moving material, e.g. running paper or textiles
8914characterised by the material examined
出願人 스미또모 가가꾸 가부시키가이샤
発明者 이무라 게이타
代理人 김진회
김태홍
優先権情報 2013117947 04.06.2013 JP
発明の名称
(KO) 결함 검사 시스템 및 필름의 제조 장치
front page image
要約
(KO) 본 발명은 결함 검사 시스템에 관한 것으로, 상기 결함 검사 시스템은, 제1 필름과 제2 필름을 접합하여 필름을 형성하는 접합 롤과, 접합 롤의 하류측에 있어서 필름이 반송되는 반송 라인과, 반송 라인에 설치된 결함 검사 장치와, 결함 검사 장치보다 하류측의 반송 라인에 설치되고, 결함 검사 장치에 의해 검출된 결함에 관한 결함 정보를 필름에 기록하는 기록 장치를 포함하고, 결함 검사 장치는, 접합 롤 이외에, 제2 필름의 제1 필름과는 반대측의 면에 최초로 접하는 롤보다 상류측의 반송 라인에 배치되어 있다.
関連特許文献
JP2014235123
CN105308441
KR1020160014630
WO/2014/196476
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