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出願の表示

1. CN113767267 - Analysis device

官庁
中華人民共和国
出願番号 201980095986.6
出願日 06.06.2019
公開番号 113767267
公開日 07.12.2021
公報種別 A
IPC
G01H 17/00
G物理学
01測定;試験
H機械振動または超音波,音波または亜音波の測定
17このサブクラスの他のグループに分類されない機械的振動または超音波,音波または亜音波の測定
G01M 99/00
G物理学
01測定;試験
M機械または構造物の静的または動的つり合い試験;他に分類されない構造物または装置の試験
99このサブクラスの他のグループに分類されない主題事項
CPC
G01H 17/00
GPHYSICS
01MEASURING; TESTING
HMEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
17Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves, not provided for in the preceding groups
G01M 99/00
GPHYSICS
01MEASURING; TESTING
MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
99Subject matter not provided for in other groups of this subclass
G01H 1/14
GPHYSICS
01MEASURING; TESTING
HMEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
1Measuring ; characteristics of; vibrations in solids by using direct conduction to the detector
12of longitudinal or not specified vibrations
14Frequency
G01H 1/003
GPHYSICS
01MEASURING; TESTING
HMEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
1Measuring ; characteristics of; vibrations in solids by using direct conduction to the detector
003of rotating machines
G01M 99/008
GPHYSICS
01MEASURING; TESTING
MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
99Subject matter not provided for in other groups of this subclass
008by doing functionality tests
出願人 MITSUBISHI ELECTRIC BUILDING TECHNO-SERVICE CO., LTD.
三菱电机大楼技术服务株式会社
発明者 NAKATANI AKIHIRO
中谷彰宏
ABE MASAYA
安部雅哉
HASHIZUME TETSURO
桥爪哲朗
ABE YOSHIHARU
阿部芳春
TERASHIMA HIDEAKI
寺岛英明
代理人 北京三友知识产权代理有限公司 11127
北京三友知识产权代理有限公司 11127
発明の名称
(EN) Analysis device
(ZH) 分析装置
要約
(EN) An analysis device (1) is provided with, e.g., a sensor (2), an analysis unit (4), an analysis unit (5), an analysis unit (6), and an integration unit (7). The analysis unit (5) divides a spectrogram acquired by the analysis unit (4) into a plurality of frequency bands, and acquires a band intensity time series for each of the plurality of frequency bands. The analysis unit (6) acquires intensity spectrograms that correspond to each of the band intensity time series. The integration unit (7) integrates the plurality of intensity spectrograms acquired by the analysis unit (6), thereby acquiring an integrated spectrogram.
(ZH) 分析装置(1)例如具备传感器(2)、分析部(4)、分析部(5)、分析部(6)以及统合部(7)。分析部(5)将由分析部(4)取得的谱图分割成多个频带,对多个频带分别取得频带强度时间序列。分析部(6)取得与频带强度时间序列分别对应的强度谱图。统合部(7)通过统合由分析部(6)取得的多个强度谱图来取得统合谱图。