処理中

しばらくお待ちください...

設定

設定

出願の表示

1. CN113614518 - PRODUCT INSPECTION METHOD AND PRODUCT INSPECTION DEVICE

官庁
中華人民共和国
出願番号 202080019264.5
出願日 25.03.2020
公開番号 113614518
公開日 05.11.2021
公報種別 A
IPC
G01N 21/84
G物理学
01測定;試験
N材料の化学的または物理的性質の決定による材料の調査または分析
21光学的手段,すなわち,赤外線,可視光線または紫外線を使用することによる材料の調査または分析
84特殊な応用に特に適合したシステム
G01N 21/85
G物理学
01測定;試験
N材料の化学的または物理的性質の決定による材料の調査または分析
21光学的手段,すなわち,赤外線,可視光線または紫外線を使用することによる材料の調査または分析
84特殊な応用に特に適合したシステム
85動いている流体または動いている粒状固体の調査
G01N 21/88
G物理学
01測定;試験
N材料の化学的または物理的性質の決定による材料の調査または分析
21光学的手段,すなわち,赤外線,可視光線または紫外線を使用することによる材料の調査または分析
84特殊な応用に特に適合したシステム
88きず,欠陥,または汚れの存在の調査
CPC
G01N 21/9508
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
95characterised by the material or shape of the object to be examined
9508Capsules; Tablets
G01N 2021/8845
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
8806Specially adapted optical and illumination features
8845Multiple wavelengths of illumination or detection
G01N 2021/95615
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
95characterised by the material or shape of the object to be examined
956Inspecting patterns on the surface of objects
95607using a comparative method
95615with stored comparision signal
出願人 USHIO DENKI K.K.
优志旺电机株式会社
TOWA PHARMACEUTICAL CO., LTD.
东和药品株式会社
発明者 YAMADA TSUYOSHI
山田刚
OTA AYA
太田彩
NAKAYAMA KOJI
中山幸治
代理人 永新专利商标代理有限公司 72002
優先権情報 2019061998 27.03.2019 JP
発明の名称
(EN) PRODUCT INSPECTION METHOD AND PRODUCT INSPECTION DEVICE
(ZH) 产品检查方法及产品检查装置
要約
(EN) To provide a new technique for performing high-speed and highly reliable quality determinations using optical measurements. Super-continuum light including a spectrum that is continuous along at least 1100-1300 nm is emitted from a pulse light source 1 and is then radiated onto a product P, with the pulse of such light being extended by an extending element 2 so that the relationship between the wavelength in a single pulse and an elapsed time is one-to-one. Having penetrated the product P, the light is received by a light receptor 3, and output data is inputted into a determination means 7. A quality determination program 43 of the determination means 7 calculates an absorption spectrum on the basis of the output data, quantifies the same using chemometrics, and compares the quantified value with a reference value, so as to make a quality determination. The product P, if determined to be of poor quality, is then excluded by means of an exclusion mechanism 8.
(ZH) 本发明提供一种通过光测定来进行高速且高可靠性的良好与否判断的新技术。至少在1100~1300nm具有连续的光谱的超晶格光从脉冲光源(1)出射,并以一脉冲中的波长与经过时间的关系成为1对1的方式被伸长元件(2)脉冲拉伸而照射到产品(P)。透过产品(P)的光被受光器(3)接收,输出数据被输入到判断单元(7)。判断单元(7)的良好与否判断程序(43)根据输出数据计算吸收光谱,利用化学计量学进行量化而与基准值进行比较,判断良好与否。被判断为是不良品的产品(P)被排除机构(8)排除。