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1. CN105308441 - 缺陷检查系统以及膜的制造装置

官庁
中華人民共和国
出願番号 201480030659.X
出願日 30.05.2014
公開番号 105308441
公開日 03.02.2016
特許番号 105308441
特許付与日 26.02.2019
公報種別 B
IPC
G01N 21/892
G物理学
01測定;試験
N材料の化学的または物理的性質の決定による材料の調査または分析
21光学的手段,すなわち,赤外線,可視光線または紫外線を使用することによる材料の調査または分析
84特殊な応用に特に適合したシステム
88きず,欠陥,または汚れの存在の調査
89動いている材料,例.紙・織物,の中の
892調査されるきず,欠陥,または対象物の特質に特徴付けられるもの
G01B 11/30
G物理学
01測定;試験
B長さ,厚さまたは同種の直線寸法の測定;角度の測定;面積の測定;表面または輪郭の不規則性の測定
11光学的手段の使用によって特徴づけられた測定装置
30表面の粗さまたは不規則性測定用
CPC
G01N 21/8422
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
8422Investigating thin films, e.g. matrix isolation method
G01N 21/896
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
89in moving material, e.g. running paper or textiles
892characterised by the flaw, defect or object feature examined
896Optical defects in or on transparent materials, e.g. distortion, surface flaws ; in conveyed flat sheet or rod
G01N 2021/8438
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
8422Investigating thin films, e.g. matrix isolation method
8438Mutilayers
G01N 2021/8848
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
8806Specially adapted optical and illumination features
8848Polarisation of light
B32B 27/08
BPERFORMING OPERATIONS; TRANSPORTING
32LAYERED PRODUCTS
BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
27Layered products comprising ; a layer of; synthetic resin
06as the main or only constituent of a layer, ; which is; next to another layer of ; the same or of; a ; different material
08of synthetic resin
B32B 41/00
BPERFORMING OPERATIONS; TRANSPORTING
32LAYERED PRODUCTS
BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
41Arrangements for controlling or monitoring lamination processes; Safety arrangements
出願人 住友化学株式会社
発明者 井村圭太
井村圭太
代理人 北京集佳知识产权代理有限公司 11227
北京集佳知识产权代理有限公司 11227
北京集佳知识产权代理有限公司 11227
北京集佳知识产权代理有限公司 11227
優先権情報 2013117947 04.06.2013 JP
発明の名称
(ZH) 缺陷检查系统以及膜的制造装置
要約
(ZH) 本发明提供缺陷检查系统以及膜的制造装置。缺陷检查系统包含:粘贴辊,其粘贴第一膜与第二膜而形成膜;输送线,其在粘贴辊的下游侧输送膜;缺陷检查装置,其被设置于输送线;以及记录装置,其被设置于比缺陷检查装置靠下游侧的输送线,并且将与通过缺陷检查装置检测出的缺陷有关的缺陷信息记录于膜,缺陷检查装置被配置于比除粘贴辊以外最初与第二膜的第一膜侧的相反侧的面接触的辊靠上游侧的输送线。