(12) International Application Status Report

Received at International Bureau: 19 January 2009 (19.01.2009)

Information valid as of: 09 July 2009 (09.07.2009)

Report generated on: 21 November 2018 (21.11.2018)

(10) Publication number: (43) Publication date: (26) Publication language:
WO 2009/09316030 July 2009 (30.07.2009) English (EN)

(21) Application number: (22) Filing date: (25) Filing language:
PCT/IB2009/05017019 January 2009 (19.01.2009) English (EN)

(31) Priority number(s): (32) Priority date(s): (33) Priority status:
08100716.3 (EP)22 January 2008 (22.01.2008) Priority document received (in compliance with PCT Rule 17.1)

(51) International Patent Classification:
G01N 33/542 (2006.01); G01N 33/543 (2006.01)

(71) Applicant(s):
KONINKLIJKE PHILIPS ELECTRONICS N. V. [NL/NL]; Groenewoudseweg 1 NL-5621 BA Eindhoven (NL) (for all designated states except US)
EVERS, Toon, H. [NL/NL]; c/o High Tech Campus 44 NL-5656 AE Eindhoven (NL) (for US only)

(72) Inventor(s):
EVERS, Toon, H.; c/o High Tech Campus 44 NL-5656 AE Eindhoven (NL)

(74) Agent(s):
VAN VELZEN, Maaike; High Tech Campus 44 NL-5656 AE Eindhoven (NL)

(54) Title (EN): DETECTION OF TARGET COMPONENTS WITH THE HELP OF INDICATOR PARTICLES
(54) Title (FR): DÉTECTION DE COMPOSANTS VOULUS AU MOYEN DE PARTICULES INDICATRICES

(57) Abstract:
(EN): The invention relates to a system and a method for the detection of target components (102) in a sample with the help of indicator particles (101) distributed in said sample. The distance (d) between indicator particles (101) and a contact surface (112) is determined after the target components could bind to the contact surface and/or the indicator particles. Thus it is possible to detect how many target components (102) are bound without a need for a binding between indicator particles (101) and contact surface (112). Optionally the indicator particles (101) can be affected by a modulated force, e.g. via an electromagnet (141). The determination of the distance (d) between indicator particles (101) and contact surface (112) may for example be achieved by frustrated total internal reflection, measurement of magnetic fields, or FRET.
(FR): L'invention concerne un système et un procédé pour détecter des composants voulus (102) dans un échantillon au moyen de particules indicatrices (101) réparties dans l'échantillon. La distance (d) entre les particules indicatrices (101) et une surface de contact (112) est déterminée après que les composants voulus se sont liés à la surface de contact et/ou aux particules indicatrices. L'invention permet de détecter combien de composants voulus (102) sont liés sans qu'une liaison soit nécessaire entre des particules indicatrices (101) et la surface de contact (112). Les particules indicatrices (101) peuvent éventuellement être soumises à une force modulée, p. ex. par l'intermédiaire d'un électro-aimant (141). La distance (d) entre les particules indicatrices (101) et la surface de contact (112) peut être déterminée par exemple par réflexion interne totale, par la mesure de champs magnétiques ou par FRET.

International search report:
Received at International Bureau: 28 April 2009 (28.04.2009) [EP]

International Report on Patentability (IPRP) Chapter II of the PCT:
Not available

(81) Designated States:
AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
European Patent Office (EPO) : AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR
African Intellectual Property Organization (OAPI) : BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG
African Regional Intellectual Property Organization (ARIPO) : BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW
Eurasian Patent Organization (EAPO) : AM, AZ, BY, KG, KZ, MD, RU, TJ, TM