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1. WO2020205384 - AGENCEMENT THERMIQUE DE MODULES DANS DES ENSEMBLES SERVEURS

Note: Texte fondé sur des processus automatiques de reconnaissance optique de caractères. Seule la version PDF a une valeur juridique

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CLAIMS

1. A method comprising:

executing a performance test on a plurality of computing modules to determine at least variability in power consumption across the plurality of computing modules;

binning the plurality of computing modules according to graduated levels of the variability in power consumption; and

selecting from among the graduated levels for placement in an assembly of ones of the computing modules in a progressively lower power consumption arrangement with relation to an airflow of the assembly.

2. The method of claim 1, wherein the variability in power consumption relates to predicted operating temperatures of the plurality of computing modules, and further comprising:

selecting placement locations in the assembly for the ones of the computing modules based on the predicted operating temperatures to establish the progressively lower power consumption arrangement.

3. The method of claim 1, wherein determining at least the variability in power consumption comprises executing the performance test to determine minimum operating voltages lower than a manufacturer specified operating voltage for at least one supply voltage common to the plurality of computing modules.

4. The method of claim 1, further comprising:

selecting from among the graduated levels to establish an average power consumption for the assembly below a threshold power level.

5. The method of claim 1, wherein a first graduated level in power consumption comprises power consumption below a power consumption threshold, and wherein a second graduated level in power consumption comprises power consumption above the power consumption threshold, and comprising:

for first ones of the plurality of computing modules corresponding to the first graduated power level, placing into locations in the assembly further downstream in the airflow than second ones of the plurality of computing modules corresponding to the second graduated power level.

6. The method of claim 1, wherein a first graduated level in power consumption comprises power consumption below a first power consumption threshold, wherein a second graduated level in power consumption comprises power consumption above a second power consumption threshold, and wherein a third graduated level in power

consumption comprises power consumption between the first power consumption threshold and the second power consumption threshold, and comprising:

for first ones of the plurality of computing modules corresponding to the first graduated power level, placing into locations in the assembly further downstream in the airflow than third ones of the plurality of computing modules; and

for the third ones of the plurality of computing modules, placing into locations in the assembly further downstream in the airflow than second ones of the plurality of computing modules corresponding to the second graduated power level.

7. The method of claim 1, wherein the performance test for each of the plurality of computing modules comprises:

iteratively booting a processing device of a target computing module into an operating system after reducing a voltage level of at least one supply voltage applied to at least one voltage domain of the target computing module;

for each reduction in the at least one supply voltage, executing a voltage characterization service to perform one or more functional tests that run one or more application level processes in the operating system and exercise processor core elements and interface elements of the processing device in context with a plurality of elements external to the processing device on the target computing module which share the at least one supply voltage;

monitoring for operational failures of at least the processing device during execution of the voltage characterization service;

based at least on the operational failures, determining at least one resultant supply voltage, wherein the at least one resultant supply voltage relates to a power consumption for the target computing module; and

wherein the iterative booting of the processing device comprises establishing a minimum operating voltage for the at least one supply voltage based on a current value of the iteratively reduced voltages, adding a voltage margin to the minimum operating voltage to establish the at least one resultant supply voltage, and instructing voltage regulator circuitry of the target computing module to supply the at least one resultant supply voltage to the processing device for operation of the processing device.

8. The method of claim 1, wherein each of the plurality of computing modules comprise a gaming system in a modular form factor configured to remotely service interactive gaming applications to end users over one or more network links.

9. An apparatus, comprising:

a circuit board assembly;

a fan assembly disposed proximate to a first end of the circuit board assembly; and a plurality of computing modules coupled to the circuit board assembly selected to achieve an average power consumption for the apparatus;

wherein the plurality of computing modules are individually characterized for power consumption properties based on results of a performance test executed by each computing module; and

wherein the plurality of computing modules are arranged on the circuit board assembly in a progressively lower power consumption arrangement with relation to an airflow of the fan assembly.

10. The apparatus of claim 9, wherein the plurality of computing modules are arranged on the circuit board assembly to locate first ones of the plurality of computing modules having power consumption levels above a threshold power consumption further upstream in the airflow than second ones of the plurality of computing module that have power consumption levels below the threshold power consumption.

11. The apparatus of claim 10, wherein third ones of the plurality of computing modules have power consumption levels between the first ones of the plurality of computing modules and the second ones of the plurality of computing modules; and

wherein the plurality of computing modules are further arranged on the circuit board assembly to locate the third ones of the plurality of computing modules between the first ones of the plurality of computing modules and the second ones of the plurality of computing modules.

12. The apparatus of claim 9, wherein individually characterizing the power consumption comprises executing the performance test to determine minimum operating voltages lower than a manufacturer specified operating voltage for at least one supply voltage common to the plurality of computing modules.

13. The apparatus of claim 9, wherein the performance test for each of the plurality of computing modules comprises:

iteratively booting a processing device of a target computing module into an operating system after reducing a voltage level of at least one supply voltage applied to at least one voltage domain of the target computing module;

for each reduction in the at least one supply voltage, executing a voltage characterization service to perform one or more functional tests that run one or more application level processes in the operating system and exercise processor core elements and interface elements of the processing device in context with a plurality of elements external to the processing device on the target computing module which share the at least one supply voltage;

monitoring for operational failures of at least the processing device during execution of the voltage characterization service;

based at least on the operational failures, determining at least one resultant supply voltage, wherein the at least one resultant supply voltage relates to a power consumption level for the target computing module; and

wherein the iterative booting of the processing device comprises establishing a minimum operating voltage for the at least one supply voltage based on a current value of the iteratively reduced voltages, adding a voltage margin to the minimum operating voltage to establish the at least one resultant supply voltage, and instructing voltage regulator circuitry of the target computing module to supply the at least one resultant supply voltage to the processing device for operation of the processing device.

14. The apparatus of claim 9, wherein each of the plurality of computing modules comprise a gaming system in a modular form factor configured to couple to the circuit board assembly and configured to remotely service interactive gaming applications to end users over one or more network links.

15. An apparatus comprising:

one or more computer readable storage media;

program instructions stored on the one or more computer readable storage media that, based at least in part on execution by a control system, direct the control system to at least:

execute a performance test on a plurality of computing modules to determine at least power consumption for the plurality of computing modules, wherein determining at least the power consumption comprises executing the performance test to determine minimum operating voltages lower than a manufacturer specified operating voltage for at least one supply voltage common to the plurality of computing modules;

sort the plurality of computing modules according to graduated power

consumption levels;

establish an average power consumption for an assembly by at least selecting first computing modules from among the graduated power consumption levels having associated power consumption properties above a threshold level and selecting second computing modules from among the graduated power consumption levels having

associated power consumption properties below the threshold level; and instruct assembly of the first computing modules upstream from the second computing modules with relation to an airflow direction in an enclosure associated with the circuit board assembly.