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1. US20160197202 - Oxide semiconductor substrate and schottky barrier diode

Note: Texte fondé sur des processus automatiques de reconnaissance optique de caractères. Seule la version PDF a une valeur juridique

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Claims

1. A schottky barrier diode element having a silicon (Si) substrate, an oxide semiconductor layer and a schottky electrode layer, wherein the oxide semiconductor layer comprises a polycrystalline and/or amorphous oxide semiconductor having a band gap of 3.0 eV or more and 5.6 eV or less.
2. The schottky barrier diode element according to claim 1, wherein the oxide semiconductor comprises one or more selected from the group consisting of In, Ti, Zn, Ga and Sn.
3. The schottky barrier diode element according to claim 1, wherein the oxide semiconductor layer comprises indium (In) as a main component.
4. The schottky barrier diode element according to claim 1, wherein the atomic composition percentage of indium relative to the total metal elements contained in the oxide semiconductor layer ([In]/([In]+[total metal elements other than In])×100) is 30 to 100 atm %.
5. The schottky barrier diode element according to claim 1, wherein the oxide semiconductor layer is formed on the silicon substrate and the schottky electrode layer is formed on the oxide semiconductor layer.
6. The schottky barrier diode element according to claim 1, wherein the schottky electrode layer is formed on the silicon substrate and the oxide semiconductor layer is formed on the schottky electrode layer.
7. The schottky barrier diode element according to claim 2, wherein the oxide semiconductor layer further comprises one or more elements selected from Al, Si, Zn, Ga, Hf, Zr, Ce, Sm and Sn.
8. The schottky barrier diode element according to claim 1, wherein the carrier concentration at room temperature of the oxide semiconductor layer is 1×10 14 cm −3 or more and 1×10 17 cm −3 or less.
9. The schottky barrier diode element according to claim 1, wherein an edge part of the oxide semiconductor layer is covered by an insulating film so as not to be exposed.
10. An electric circuit comprising the schottky barrier diode element according to claim 1.
11. An electric apparatus comprising the schottky barrier diode element according to claim 1.
12. An electronic apparatus comprising the schottky barrier diode element according to claim 1.
13. A vehicle comprising the schottky barrier diode element according to claim 1.
14. A structural body comprising an oxide semiconductor layer and a metal thin film, wherein
the oxide semiconductor layer comprises polycrystalline and/or amorphous oxide semiconductor having a band gap of 3.0 eV or more and 5.6 eV or less;
the oxide semiconductor comprises In as a main component;
the oxide semiconductor is crystalline and comprises at least one element selected from Al, Si, Ce, Ga, Hf, Zr, Sm, Zn and Sn, and if at least one element selected from Al, Si, Ce, Ga, Hf, Zr and Sm is contained, the content thereof is 3 at % or more and 30 at % or less relative to the total metal elements, if Zn is contained, the content thereof is 5 at % or more and 40 at % or less relative to the total metal elements, and if Sn is contained, the content thereof is 500 ppm at % or more and 3 at % or less relative to the total metal elements; and
the structural body comprises a region where the oxide semiconductor layer electrically contacts the metal thin film.
15. The structural body according to claim 14, wherein the metal thin film has a work function of 4.7 eV or more.
16. The structural body according to claim 14, wherein the oxide semiconductor has a carrier concentration at room temperature of 1×10 14 cm −3 or more and 1×10 17 cm −3 or less.
17. The structural body according to claim 14, wherein the film thickness of the oxide semiconductor layer is 50 nm to 20 μm.
18. An oxide semiconductor substrate in which the structural body according to claim 14 is stacked on a conductive substrate.
19. The oxide semiconductor substrate according to claim 18, wherein the conductive substrate is composed of one or more selected from monocrystalline silicone, polycrystalline silicon and microcrystal silicon.
20. An oxide semiconductor substrate in which the structural body according to claim 14 is stacked on an electrically insulating substrate.
21. A power semiconductor element in which the oxide semiconductor substrate according to claim 18 is used.
22. A diode element in which the oxide semiconductor substrate according to claim 18 is used.
23. A schottky barrier diode element in which the oxide semiconductor substrate according to claim 18 is used.
24. The schottky barrier diode element according to claim 23, wherein the metal thin film serves as a schottky electrode layer.
25. A structural body comprising an oxide semiconductor layer and a metal thin film, wherein
the oxide semiconductor layer comprises polycrystalline and/or amorphous oxide semiconductor having a band gap of 3.0 eV or more and 5.6 eV or less;
the metal thin film has a work function of 4.7 eV or more and the metal thin film comprises Au, Fe, Ir, Nb, Ni, Pd, Pt, Re or Ru; and
the structural body comprises a region where the oxide semiconductor layer electrically contacts the metal thin film.
26. The structural body according to claim 25, wherein the oxide semiconductor comprises In as a main component.
27. The structural body according to claim 25, wherein the oxide semiconductor is crystalline and comprises at least one element selected from Al, Si, Ce, Ga, Hf, Zr, Sm, Zn and Sn, and
if at least one element selected from Al, Si, Ce, Ga, Hf, Zr and Sm is contained, the content thereof is 3 at % or more and 30 at % or less relative to the total metal elements, if Zn is contained, the content thereof is 5 at % or more and 40 at % or less relative to the total metal elements, and if Sn is contained, the content thereof is 500 ppm at % or more and 3 at % or less relative to the total metal elements.
28. The structural body according to claim 25, wherein the oxide semiconductor has a carrier concentration at room temperature of 1×10 14 cm −3 or more and 1×10 17 cm −3 or less.
29. The structural body according to claim 25, wherein the film thickness of the oxide semiconductor layer is 50 nm to 20 μm.
30. An oxide semiconductor substrate in which the structural body according to claim 25 is stacked on a conductive substrate.
31. The oxide semiconductor substrate according to claim 30, wherein the conductive substrate is composed of one or more selected from monocrystalline silicone, polycrystalline silicon and microcrystal silicon.
32. An oxide semiconductor substrate in which the structural body according to claim 25 is stacked on an electrically insulating substrate.
33. A power semiconductor element in which the oxide semiconductor substrate according to claim 30 is used.
34. A diode element in which the oxide semiconductor substrate according to claim 30 is used.
35. A schottky barrier diode element in which the oxide semiconductor substrate according to claim 30 is used.
36. The schottky barrier diode element according to claim 35, wherein the metal thin film serves as a schottky electrode layer.