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1. WO2020163113 - SYSTÈMES ET PROCÉDÉS DE BALAYAGE TÉLÉCENTRIQUES MACRO-MICRO

Note: Texte fondé sur des processus automatiques de reconnaissance optique de caractères. Seule la version PDF a une valeur juridique

[ EN ]

CLAIM(S):

1. A dual mode imaging system, comprising:

a sample platform configured to hold a sample, the sample platform being movable relative to an optical imaging system between a first location and a second location; and

a light source subsystem including an illumination source configured to generate an illumination beam, the light source subsystem comprising beam-shaping optics configured to project the illumination beam onto a part of a focal plane;

relay optics configured to receive and redirect the illumination beam through an objective lens when the sample platform is in the second location;

a detector subsystem for detecting light from the sample platform, and comprising a light detector having an array of sensing locations; and

the optical imaging system, comprising optical elements configured to receive light from the sample platform along a first detection light path and to pass or to direct the received light to the light detector along a second detection light path;

wherein when the sample platform is in the first location, the sample platform coincides with the focal plane, the illumination beam impinges on at least a portion of the sample platform, and the optical imaging system receives light from the portion of the sample platform along the first detection light path; and

wherein when the sample platform is in the second location the illumination beam interacts with the relay optics and impinges on at least a portion of the sample platform through the objective lens and the light from the portion of the sample platform is directed back through the objective lens and relay optics and to the optical imaging system along the first detection path.

2. The dual mode imaging system of claim 1, wherein the beam-shaping optics includes one or more optical elements configured to reshape a profile of the illumination beam to a line shaped profile at the focal plane.

3. The dual mode imaging system of claim 1, wherein the relay optics includes a scanning mirror in a light path of the relay optics.

4. The dual mode imaging system of claim 1, wherein the optical imaging system comprises a bi-telecentric optical imaging system including imaging optics arranged and positioned such that a first telecentric space exists in the first detection light path between the sample platform and an entry aperture, wherein Principal rays from a plurality of field points on the sample platform are parallel to each other when passing through a first filter in the first detection light path, and such that a second telecentric space exists in the second detection light path between the light detector and an exit aperture, wherein the Principal rays from the plurality of field points are parallel to each other when passing through a second filter in the second detection light path.

5. The dual mode imaging system of claim 4, wherein the bi-telecentric optical imaging system comprises an Offner relay mirror system arrangement comprising a first mirror element having a spherical mirror surface and a second mirror element having a spherical mirror surface, wherein the entry aperture and the exit aperture each comprise a portion of the first mirror element.

6. The dual mode imaging system of claim 1, wherein the optical imaging system is a fluorescence imaging system, wherein the sample includes one or more targets of interest that comprises fluorescent material, and wherein the illumination beam has a wavelength in an absorption band of the fluorescent material.

7. The dual mode imaging system of claim 1, wherein the light source subsystem comprises: a single-mode laser configured to output an illumination beam having a single-mode profile;

a multi-mode laser configured to output an illumination beam having a multi-mode profile, wherein a beam waist size of the multi-mode profile illumination beam is greater than a beam waist size of the single-mode profile illumination beam;

correction optics configured to reduce the beam waist size of the multi-mode illumination beam to substantially the same size as the beam waist size of the single-mode illumination beam; beam-combining optics configured to combine the single-mode illumination beam and the multi-mode illumination beam into a combined illumination beam along a first illumination light path; and

beam-shaping optics configured to shape a profile of the combined illumination beam to a spot-shaped illumination profile at the focal plane.

8. The dual mode imaging system of claim 7, wherein the beam-shaping optics includes a scanning mirror configured to controllably scan the spot-shaped illumination profile so as to form a line-shaped illumination profile at the focal plane.

9. The dual mode imaging system of claim 1, wherein the sample platform being movable includes that one or both of the sample platform and the optical imaging system is moved relative to the other such that the sample platform is located in one of the first location or the second location relative to the optical imaging system.

10. The dual mode imaging system of claim 1, further including a control system module comprising at least one processor, wherein the control system module is communicably coupled with and adapted to control operation of the light source subsystem, the detector subsystem and a translation mechanism coupled to the sample platform and/or the imaging system and configured to adjust the location of the sample platform relative to the imaging system between the first location and the second location.

11. A dual mode imaging system, comprising:

a sample platform configured to hold a sample;

a detector subsystem for detecting light from the sample platform, and comprising a light detector having an array of sensing locations; and

an optical imaging system comprising optical elements configured to receive light from the sample platform along a first detection light path and to pass or to direct the received light to the light detector along a second detection light path;

relay optics configured to receive and redirect the light from the sample platform through an objective lens when the sample platform is in a second location relative to the optical imaging system; and

an illumination source configured to generate illumination and direct the illumination to impinge on at least a portion of the sample platform from a side opposite a side on which the optical imaging system is located;

wherein the sample platform is movable relative to the optical imaging system between a first location and the second location;

wherein when the sample platform is in the first location, the optical imaging system receives light directly from a portion of the sample platform along the first detection light path; and

wherein when the sample platform is in the second location light from the portion of the sample platform is directed back through the objective lens and the relay optics and to the optical imaging system along the first detection path.

12. The dual mode imaging system of claim 11, wherein the illumination source includes a light source configured to emit the illumination and to move with the sample platform when the sample platform is moved from the first location to the second location.

13. The dual mode imaging system of claim 11, wherein the illumination source includes a first light source configured to illuminate at least a portion of the sample platform when the sample platform is in the first location, and a second light source configured to illuminate at least a portion of the sample platform when the sample platform is in the second location.

14. The dual mode imaging system of claim 11, wherein the illumination source includes a light source and illumination relay optics, wherein the light source is configured to illuminate at least a portion of the sample platform directly when the sample platform is in the first location, and wherein the illumination relay optics redirect the illumination from the light source to impinge on the portion of the sample platform when the sample platform is in the second location

15. The dual mode imaging system of claim 11, wherein the optical imaging system is a fluorescence imaging system, wherein the sample includes one or more targets of interest that comprises fluorescent material, and wherein the illumination has a wavelength in an absorption band of the fluorescent material.

16. A method of imaging a sample using a dual mode imaging system having an illumination source and a detector system, the method comprising;

providing a sample on a sample platform;

generating an illumination beam by the illumination source;

in a macro-imaging mode:

automatically positioning the sample platform in a first location, wherein the illumination beam impinges directly on at least a portion of the sample platform and wherein light from the portion of the sample platform passes directly to the detector system; and

imaging the sample platform using the detector system; and

in a micro-imaging mode:

automatically positioning the sample platform in a second location, wherein the illumination beam is redirected through an objective lens toward at least a portion of the sample platform by relay optics, and wherein light from the portion of the sample platform passes back through the objective lens and relay optics to the detector system; and

imaging the sample platform using the detector system, wherein a resolution of the image captured in the micro-imaging mode is greater than a resolution of the image captured in the macro-imaging mode.

17. The method of claim 16, wherein the dual mode imaging system is a fluorescence imaging system, wherein the sample includes one or more targets of interest that comprises fluorescent material, and wherein the illumination beam has a wavelength in an absorption band of the fluorescent material.

18. The dual mode imaging system of claim 1, wherein the beam shaping optics includes a Fly’s Eye condenser element.

19. The dual mode imaging system of claim 1, wherein the relay optics includes a Fly’s Eye condenser element.

40 Relais microscope (non utilise pendant le macro-balayage) 30 Module de combinaison laser

20 Imageur bitelecentrique

10 Echantillon

AA Optique de generation de ligne