Colecciones nacionales e internacionales de patentes

1. (WO2014090938) CONDUCTIVE ATOMIC FORCE MICROSCOPE TIPS COATED WITH GRAPHENE

Pub. No.:    WO/2014/090938    International Application No.:    PCT/EP2013/076362
Publication Date: Fri Jun 20 01:59:59 CEST 2014 International Filing Date: Fri Dec 13 00:59:59 CET 2013
IPC: G01Q 60/40
G01Q 70/14
Applicants: UNIVERSITAT AUTONOMA DE BARCELONA
PEKING UNIVERSITY
DUAN, Huiling
PORTI PUJAL, Marc
LANZA MARTINEZ, Mario
BAYERL, Albin
NAFRÍA MAQUEDA, Montserrat
Inventors: DUAN, Huiling
PORTI PUJAL, Marc
LANZA MARTINEZ, Mario
BAYERL, Albin
NAFRÍA MAQUEDA, Montserrat
Title: CONDUCTIVE ATOMIC FORCE MICROSCOPE TIPS COATED WITH GRAPHENE
Abstract:
The present invention relates to coating with a graphene single layer film the conductive surface of an atomic force microscope tip. The process of coating the conductive surface with graphene consists in three steps: first, immobilization of the tip on a Silicon block as a base using a thin film of Poly-methyl methacrylate (PMMA) in between. Then, the solid PMMA/AFM tip/PMMA/Silicon block was used as target substrate on which it is transferred the graphene sheet. Finally, it is removed the different PMMA layers using Acetone. Once PMMA is removed, the graphene is completely attached. The resulting tip is perfectly coated with graphene, and therefore much more resistant to both high currents and frictions than commercially available metal-varnished CAFM tips, and also to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction.