Feedback
Settings

Settings

Goto Application

2,074,740 results
Offices all Languages Stemming true Single Family Member true Include NPL false
RSS feed can only be generated if you have a WIPO account

Save query

A private query is only visible to you when you are logged-in and can not be used in RSS feeds

Query Tree

Refine Options

Offices
All
Specify the language of your search keywords
Stemming reduces inflected words to their stem or root form.
For example the words fishing, fished,fish, and fisher are reduced to the root word,fish,
so a search for fisher returns all the different variations
Returns only one member of a family of patents
Include Non-Patent literature in results

Full Query

IC:G01N

Side-by-side view shortcuts

General
Go to Search input
CTRL + SHIFT +
Go to Results (selected record)
CTRL + SHIFT +
Go to Detail (selected tab)
CTRL + SHIFT +
Go to Next page
CTRL +
Go to Previous page
CTRL +
Results (First, do 'Go to Results')
Go to Next record / image
/
Go to Previous record / image
/
Scroll Up
Page Up
Scroll Down
Page Down
Scroll to Top
CTRL + Home
Scroll to Bottom
CTRL + End
Detail (First, do 'Go to Detail')
Go to Next tab
Go to Previous tab

Analysis

1 / 207,474
1.WO/2024/085757METHOD AND SYSTEM FOR PROCESSING A PLURALITY OF AVIAN EGGS
WO - 25.04.2024
Int.Class A01K 43/08
AHUMAN NECESSITIES
01AGRICULTURE; FORESTRY; ANIMAL HUSBANDRY; HUNTING; TRAPPING; FISHING
KANIMAL HUSBANDRY; AVICULTURE; APICULTURE; PISCICULTURE; FISHING; REARING OR BREEDING ANIMALS, NOT OTHERWISE PROVIDED FOR; NEW BREEDS OF ANIMALS
43Testing, sorting, or cleaning eggs
04Grading eggs
08according to weight
 Appl.No PCT/NL2023/050548 Applicant MOBA GROUP B.V. Inventor PELLARIN, Lars
Method for processing a plurality of avian eggs, in particular unfertilized eggs, including: -conveying each egg (E) along a conveying path; -generating a plurality of images of each egg (E) from different sides of the egg using illumination light (B); and processing the plurality of images of each egg (E), by a digital image processor (8), utilizing a trained learning model to determine a mass of the egg, and outputting the determined mass of the egg, for example for classifying the egg.
2.WO/2024/084752LASER IRRADIATION SYSTEM, LASER IRRADIATION METHOD, AND METHOD FOR MANUFACTURING ORGANIC EL DISPLAY
WO - 25.04.2024
Int.Class G01N 21/956
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws, defects or contamination
95characterised by the material or shape of the object to be examined
956Inspecting patterns on the surface of objects
 Appl.No PCT/JP2023/025734 Applicant JSW AKTINA SYSTEM CO., LTD. Inventor SHIMOJI Teruaki
This laser irradiation system (1) comprises: a conveyance stage (150); an observation device (110) for imaging a workpiece; a laser irradiation unit (170) which irradiates the workpiece inspected by the observation device with a laser beam; a dust collection mechanism (130) which suctions a gas around a region irradiated with the laser beam; a processing unit (20) which performs quality judgment for the workpiece on the basis of a captured image of the workpiece captured before the irradiation with the laser beam; and a control unit which, when the workpiece is determined as a defective product, controls a conveyance stage so that the workpiece is not conveyed toward the laser irradiation unit.
3.WO/2024/082952SURFACE-ENHANCED RAMAN SCATTERING COMPOSITE SUBSTRATE, AND PREPARATION METHOD THEREFOR AND USE THEREOF
WO - 25.04.2024
Int.Class C03C 17/00
CCHEMISTRY; METALLURGY
03GLASS; MINERAL OR SLAG WOOL
CCHEMICAL COMPOSITION OF GLASSES, GLAZES, OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
17Surface treatment of glass, e.g. of devitrified glass, not in the form of fibres or filaments, by coating
 Appl.No PCT/CN2023/122399 Applicant ZHUHAI INSTITUTE OF ADVANCED TECHNOLOGY CO., LTD. Inventor XU, Lin
The present invention relates to the technical field of Raman detection. Disclosed are a surface-enhanced Raman scattering composite substrate, and a preparation method therefor and a use thereof. The preparation method comprises the following steps: dissolving cyanamide salt and poly(3-hexylthiophene) in a solvent to obtain a mixed solution; and coating the mixed solution on a glass sheet, and drying same to obtain a composite substrate; wherein the cyanamide salt is selected from at least one of silver cyanamide, zinc cyanamide and silver dicyandiamide. Poly(3-hexylthiophene) and the cyanamide salt are selected to prepare a composite film to serve as the surface-enhanced Raman scattering composite substrate, and the composite substrate layer is used in Raman spectrum detection, has high detection sensitivity, strong stability and strong reusability, and can be widely used in the detection of organic dye molecules, such as methylene blue, crystal violet or azure I. The composite substrate provided by the present invention has low preparation costs and simple preparation method.
4.WO/2024/085982SYSTEMS AND METHODS FOR IDENTIFYING WAVEGUIDE DEFECTS
WO - 25.04.2024
Int.Class G06T 7/00
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
7Image analysis
 Appl.No PCT/US2023/033293 Applicant VIASAT, INC. Inventor COVER, Matthew
Systems and methods are described herein for waveguide defect detection. In some examples, a statistical value of pixels of a number of image locations in one or more images of the waveguide can be computed. An extremity matrix can be generated based on an anomaly detector model and statistical pixel data that includes statistical values computed for respective image locations in the one or more images of the waveguide. A decision can be made to determine whether the waveguide is a conforming or a non-conforming waveguide based on the extremity matrix and a set of thresholds. In some examples, the statistical value is a mean intensity value or an average intensity value.
5.WO/2024/086492LIGHT BOX SYSTEM FOR OPTICAL ASSAY INTERROGATION
WO - 25.04.2024
Int.Class G01N 21/84
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
84Systems specially adapted for particular applications
 Appl.No PCT/US2023/076808 Applicant BECTON, DICKINSON AND COMPANY Inventor WANG, Vivian
Aspects of the present disclosure relate to light boxes capable of improving imaging of point-of-care test devices. In one aspect, a disposable light box can also function as packaging for a test device. In one aspect, a light box includes integrated light sources. In one aspect, a layer of PTFE can be applied to an interior surface of a light box to improve light distribution to a top surface of the test device received inside the light box.
6.WO/2024/085472APPARATUS FOR TESTING DEGREE OF SECESSION OF ELECTRODE ACTIVE MATERIAL
WO - 25.04.2024
Int.Class G01N 19/04
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
19Investigating materials by mechanical methods
04Measuring adhesive force between materials, e.g. of sealing tape, of coating
 Appl.No PCT/KR2023/014176 Applicant LG ENERGY SOLUTION, LTD. Inventor KIM, Byeongjo
An apparatus for automatically testing a degree of secession of an electrode active material according to an example of the present invention comprises: a tape-supplying member for supplying a tape; a tape-adhesion member for pressing the tape to adhere to the electrode; and a testing unit for checking a degree of secession of the active material on the electrode, wherein the electrode and the tape are pressed together by the tape-adhesion member and then separated, thereby creating secession of the active material of the electrode.
7.WO/2024/084782IMAGE ACQUISITION DEVICE, INSPECTION DEVICE, AND IMAGE ACQUISITION METHOD
WO - 25.04.2024
Int.Class G01N 21/84
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
84Systems specially adapted for particular applications
 Appl.No PCT/JP2023/028774 Applicant HAMAMATSU PHOTONICS K.K. Inventor KONDO Hideyuki
An image acquisition device 1 comprises: an illumination device 2 that irradiates a subject S with light from the range of a light irradiation unit 2a; and an imaging device 7 that detects, through an imaging lens 7a, light that has been specularly reflected by the subject S. A straight line that connects the center of the light irradiation unit 2a with a point of intersection between the optical axis of the imaging lens 7a and the subject S is set to be inclined 2-120 degrees with respect to the optical axis. The solid angle of the light irradiation unit 2a as viewed from said point of intersection is set to be 0-0.15 steradians.
8.WO/2024/082187PIPETTING APPARATUS FOR FLUIDIC CHIP, AND PIPETTING METHOD FOR FLUIDIC CHIP
WO - 25.04.2024
Int.Class G01N 35/10
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/-G01N33/148; Handling materials therefor
10Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
 Appl.No PCT/CN2022/126278 Applicant BGI SHENZHEN Inventor YAO, Junlei
The present invention relates to the technical field of biological chips. Provided are a pipetting apparatus for a fluidic chip, and a pipetting method for a fluidic chip. The pipetting apparatus for a fluidic chip comprises a working platform, a moving component, a pipetting device and a drying device, wherein the working platform comprises a fluidic-chip placement area; the moving component can move above the working platform; the pipetting device is arranged on the moving component and is used for performing liquid injection and/or liquid suction on fluidic chips; and the drying device is used for injecting gas into flow channels of the fluidic chips. By means of adding the drying device so as to accelerate the circulation of the gas inside the fluidic chips, the drying efficiency for the fluidic chips is improved, such that the drying time is greatly shortened, thereby avoiding the residue of liquids in the flow channels of the fluidic chips; moreover, a pipetting operation is carried out by means of the moving component driving the pipetting device, such that there is no need to manually use a pipette to carry out the pipetting operation, thereby preventing operators from coming into contact with chemicals, and achieving a high degree of automation and making the present invention safer.
9.WO/2024/083342X-RAY MEASUREMENT ARRANGEMENT FOR EXAMINING TEST OBJECTS BY MEANS OF X-RAY RADIATION AND METHOD FOR EXAMINING TEST OBJECTS BY MEANS OF X-RAY RADIATION
WO - 25.04.2024
Int.Class G01N 23/02
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
02by transmitting the radiation through the material
 Appl.No PCT/EP2022/079408 Applicant CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH Inventor KRENKEL, Martin
The invention relates to an X-ray measurement arrangement (1) for examining test objects (20) by means of X-ray radiation, comprising a rotatable receiving device (2), an X-ray examination device (3) having at least one X-ray source (4) and at least one X-ray detector (5), wherein the at least one X-ray source (4) and the at least one X-ray detector (5) are arranged on the rotatable receiving device (2), and at least one positioning device (7), which is configured to arrange at least one predetermined region of interest (20-1) of a test object (20) in a detection area (8) of the X-ray examination device (3) on an axis of rotation (9) of the rotatable receiving device (2), between the at least one X-ray source (4) and the at least one X-ray detector (5) and to hold it there during the examination. The invention also relates to a method for examining test objects (20) by means of X-ray radiation.
10.WO/2024/082607STRUCTURED ILLUMINATION MICROSCOPY METHOD BASED ON PRINCIPAL COMPONENT ANALYSIS
WO - 25.04.2024
Int.Class G01N 21/64
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63optically excited
64Fluorescence; Phosphorescence
 Appl.No PCT/CN2023/092145 Applicant NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY Inventor ZUO, Chao
A structured illumination microscopy method based on principal component analysis. The method specifically comprises: step 1: acquiring an original illumination image of a sample required by structured illumination super-resolution; step 2: separating three pieces of spectral information of the sample; step 3: extracting the central energy of a level-1 spectrum by means of a double-window frequency-domain masking operator; step 4: acquiring an illumination vector factor; step 5: extracting a principal component of the illumination vector factor; step 6: accurately estimating an illumination parameter from the principal component of the illumination vector factor; and step 7: carrying out accurate spectral separation and super-resolution image reconstruction. By extracting a "first principal component" dominated by the illumination parameter, an interference item affecting the accurate estimation of the illumination parameter is fundamentally eliminated, thereby accurately identifying a wave vector with sub-pixel precision and an initial phase in a simple and efficient manner. In addition, a double-window frequency-domain masking operator is used to further suppress interference noise, and the data volume involved in principal component analysis is reduced by nearly thousand times, thereby greatly improving the calculation efficiency, accuracy and stability of illumination parameter estimation.
# -