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1. CN103901380 - Calibration method and calibration device thereof

Office
China
Application Number 201210572980.3
Application Date 25.12.2012
Publication Number 103901380
Publication Date 02.07.2014
Grant Number 103901380
Grant Date 13.07.2018
Publication Kind B
IPC
G01R 35/00
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
35Testing or calibrating of apparatus covered by the other groups of this subclass
Applicants 北京普源精电科技有限公司
Inventors 梁斌
王悦
王铁军
李维森
Agents 北京卓岚智财知识产权代理事务所(特殊普通合伙) 11624
Title
(EN) Calibration method and calibration device thereof
(ZH) 校准方法及其校准装置
Abstract
(EN)
The invention provides a calibration method and a calibration device thereof. The calibration method comprises the following steps: a calibration point is found; and calibration is performed on the found calibration point. The calibration point finding step comprises the following steps: measuring signals are scanned with a fixed frequency interval to generate a reference curve; two points on the reference curve are connected to generate a calibration straight line; the magnitude relationship between the vertical distance between the points on the reference curve and the calibration straight line and a calibration parameter is calculated; and a calibration point is generated according to the magnitude relationship. According to the calibration method and the calibration device thereof of the invention, not only all points exceeding indexes can be found out ensure the instrument measuring indexes, and but also no excessive calibration point needs to be extracted in the method, so the instrument indexes can be ensured, so that less calibration time will be used compared with the prior art on the premise of ensuring same indexes.

(ZH)
本发明提供了一种校准方法及其校准装置,校准方法包括以下步骤:查找校准点;对找到的校准点进行校准,所述的查找校准点的步骤包括:以一个固定频率间隔扫描测量信号,生成基准曲线;连接所述的基准曲线上的两点,生成校准直线;计算所述的基准曲线上的点到所述的校准直线的竖直距离与一个校准参数的大小关系;根据上述的大小关系,产生校准点。本发明所述的校准方法及其校准装置,不仅能够找到所有的超出指标点,保证仪器的测量指标,而且这种方法不用取过多的校准点,就能保证仪器指标,因此在保证同样的指标的前提下,会比现有技术使用较少的校准时间。