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1. CN103676243 - Array substrate assembly, measurement method of array substrate assembly and display device

Office China
Application Number 201310722566.0
Application Date 24.12.2013
Publication Number 103676243
Publication Date 26.03.2014
Grant Number 103676243
Grant Date 15.02.2017
Publication Kind B
IPC
G02F 1/13
GPHYSICS
02OPTICS
FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
1Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
01for the control of the intensity, phase, polarisation or colour
13based on liquid crystals, e.g. single liquid crystal display cells
G02F 1/1362
GPHYSICS
02OPTICS
FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
1Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
01for the control of the intensity, phase, polarisation or colour
13based on liquid crystals, e.g. single liquid crystal display cells
133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
1362Active matrix addressed cells
Applicants BOE TECHNOLOGY GROUP CO., LTD.
京东方科技集团股份有限公司
BEIJING BOE DISPLAY TECHNOLOGY CO., LTD.
北京京东方显示技术有限公司
Inventors YAN YAN
闫岩
MA YU
马禹
FENG BO
冯博
Agents chai liang zhang tianshu
北京天昊联合知识产权代理有限公司 11112
北京天昊联合知识产权代理有限公司 11112
Title
(EN) Array substrate assembly, measurement method of array substrate assembly and display device
(ZH) 一种阵列基板组件及其测量方法和显示装置
Abstract
(EN)
The invention provides an array substrate assembly, a detection method of the array substrate assembly and a display device, and belongs to the technical field of display. By means of the array substrate assembly, the problem that in the prior art, grid line delayed signals of an array substrate driven by a double-edge array grid can not be measured. The array substrate assembly comprises a plurality of first signal lines and a plurality of second signal lines, wherein the first signal lines and the second signal lines are crossed; the first ends of the first signal lines are connected with a first drive unit, the second ends of the first signal lines are connected with a second drive unit, and one end of each second signal line extends to a printed circuit board, wherein the ends, extending to the printed circuit board, of the second signal lines are reserved as detection points. The detection method includes the first step of selecting the first signal lines to be detected and selecting one second signal line as a first detection line, wherein the first signal lines and the first detection line are crossed at a first crossed position and the first signal lines and the first detection line are connected at the first crossed position, and the second step of using the detection point to detect the first signal lines to be detected. The display device comprises the array substrate assembly.

(ZH)
本发明提供一种阵列基板组件及其检测方法和显示装置,属于显示技术领域,其可解决现有技术中的采用双边阵列栅极驱动的阵列基板的栅线信号延迟无法测量的问题。本发明的阵列基板组件包括多条相互交叉的第一信号线和第二信号线,所述第一信号线的第一端与第一驱动单元连接,第二端与第二驱动单元连接,第二信号线的一端延伸至印刷电路板,其中,第二信号线的延伸至印刷电路板的一端预留为测试点。检测方法包括选取待检测的第一信号线,选取一条第二信号线为第一检测线,第一信号线和第一检测线在第一交叉处相互交叉,并在第一交叉处将第一信号线和第一检测线导通;应用所述测试点对待检测的第一信号线进行检测。显示装置包括上述阵列基板组件。