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1. WO2022164659 - QUASI-VOLATILE MEMORY WITH REFERENCE BIT LINE STRUCTURE

Publication Number WO/2022/164659
Publication Date 04.08.2022
International Application No. PCT/US2022/012521
International Filing Date 14.01.2022
IPC
G11C 11/40 2006.1
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
11Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
21using electric elements
34using semiconductor devices
40using transistors
G11C 11/409 2006.1
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
11Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
21using electric elements
34using semiconductor devices
40using transistors
401forming cells needing refreshing or charge regeneration, i.e. dynamic cells
4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
407for memory cells of the field-effect type
409Read-write circuits
G11C 11/4097 2006.1
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
11Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
21using electric elements
34using semiconductor devices
40using transistors
401forming cells needing refreshing or charge regeneration, i.e. dynamic cells
4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
407for memory cells of the field-effect type
409Read-write circuits
4097Bit-line organisation, e.g. bit-line layout, folded bit lines
G11C 11/416 2006.1
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
11Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
21using electric elements
34using semiconductor devices
40using transistors
41forming cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
413Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
414for memory cells of the bipolar type
416Read-write circuits
G11C 11/419 2006.1
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
11Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
21using electric elements
34using semiconductor devices
40using transistors
41forming cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
413Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
417for memory cells of the field-effect type
419Read-write circuits
G11C 7/12 2006.1
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
7Arrangements for writing information into, or reading information out from, a digital store
12Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
CPC
G11C 11/223
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
11Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
21using electric elements
22using ferroelectric elements
223using MOS with ferroelectric gate insulating film
G11C 11/2273
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
11Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
21using electric elements
22using ferroelectric elements
225Auxiliary circuits
2273Reading or sensing circuits or methods
G11C 16/0466
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
16Erasable programmable read-only memories
02electrically programmable
04using variable threshold transistors, e.g. FAMOS
0466comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS]
G11C 16/26
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
16Erasable programmable read-only memories
02electrically programmable
06Auxiliary circuits, e.g. for writing into memory
26Sensing or reading circuits; Data output circuits
G11C 16/28
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
16Erasable programmable read-only memories
02electrically programmable
06Auxiliary circuits, e.g. for writing into memory
26Sensing or reading circuits; Data output circuits
28using differential sensing or reference cells, e.g. dummy cells
G11C 7/227
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
7Arrangements for writing information into, or reading information out from, a digital store
22Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
227Timing of memory operations based on dummy memory elements or replica circuits
Applicants
  • SUNRISE MEMORY CORPORATION [US]/[US]
Inventors
  • PETTI, Christopher J.
Agents
  • COOK, Carmen C.
Priority Data
63/142,14427.01.2021US
Publication Language English (en)
Filing Language English (EN)
Designated States
Title
(EN) QUASI-VOLATILE MEMORY WITH REFERENCE BIT LINE STRUCTURE
(FR) MÉMOIRE QUASI-VOLATILE DOTÉE D'UNE STRUCTURE DE LIGNE DE BITS DE RÉFÉRENCE
Abstract
(EN) A semiconductor memory device is implemented as strings of storage transistors, where the storage transistors in each string have drain terminals connected to a bit line and gate terminals connected to respective word lines. In some embodiments, the semiconductor memory device includes a reference bit line structure to provide a reference bit line signal for read operation. The reference bit line structure configures word line connections to provide a reference bit line to be used with a storage transistor being selected for read access. The reference bit line structure provides a reference bit line having the same electrical characteristics as an active bit line and is configured so that no storage transistors are selected when a word line is activated to access a selected storage transistor associated with the active bit line.
(FR) Dispositif de mémoire à semi-conducteurs mis en œuvre en tant que chaînes de transistors de stockage, les transistors de stockage dans chaque chaîne comprenant des bornes de drain connectées à une ligne de bits et des bornes de grille connectées à des lignes de mots respectives. Dans certains modes de réalisation, le dispositif de mémoire à semi-conducteurs comprend une structure de ligne de bits de référence afin de fournir un signal de ligne de bits de référence pour une opération de lecture. La structure de ligne de bits de référence configure des connexions de lignes de mots afin de fournir une ligne de bits de référence à utiliser avec un transistor de stockage sélectionné pour un accès en lecture. La structure de ligne de bits de référence fournit une ligne de bits de référence présentant les mêmes caractéristiques électriques qu'une ligne de bits active et est configurée de sorte qu'aucun transistor de stockage ne soit sélectionné lorsqu'une ligne de mots est activée pour accéder à un transistor de stockage sélectionné associé à la ligne de bits active.
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