Processing

Please wait...

Settings

Settings

Goto Application

1. WO2022164574 - LEAD FRAMES FOR SEMICONDUCTOR PACKAGES WITH INCREASED RELIABILITY AND RELATED PACKAGES AND METHODS

Publication Number WO/2022/164574
Publication Date 04.08.2022
International Application No. PCT/US2021/070567
International Filing Date 17.05.2021
IPC
H01L 23/495 2006.1
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
23Details of semiconductor or other solid state devices
48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads or terminal arrangements
488consisting of soldered or bonded constructions
495Lead-frames
CPC
H01L 21/4821
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
21Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
02Manufacture or treatment of semiconductor devices or of parts thereof
04the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
4814Conductive parts
4821Flat leads, e.g. lead frames with or without insulating supports
H01L 2224/16245
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
2224Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
10Bump connectors; Manufacturing methods related thereto
15Structure, shape, material or disposition of the bump connectors after the connecting process
16of an individual bump connector
161Disposition
16151the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
16221the body and the item being stacked
16245the item being metallic
H01L 2224/17
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
2224Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
10Bump connectors; Manufacturing methods related thereto
15Structure, shape, material or disposition of the bump connectors after the connecting process
17of a plurality of bump connectors
H01L 23/49503
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
23Details of semiconductor or other solid state devices
48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; ; Selection of materials therefor
488consisting of soldered ; or bonded; constructions
495Lead-frames ; or other flat leads
49503characterised by the die pad
H01L 23/4951
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
23Details of semiconductor or other solid state devices
48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; ; Selection of materials therefor
488consisting of soldered ; or bonded; constructions
495Lead-frames ; or other flat leads
49503characterised by the die pad
4951Chip-on-leads or leads-on-chip techniques, i.e. inner lead fingers being used as die pad
H01L 23/49541
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
23Details of semiconductor or other solid state devices
48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; ; Selection of materials therefor
488consisting of soldered ; or bonded; constructions
495Lead-frames ; or other flat leads
49541Geometry of the lead-frame
Applicants
  • MICROCHIP TECHNOLOGY INCORPORATED [US]/[US]
Inventors
  • MEHR, Behrooz
Agents
  • WATSON, James C.
  • BACA, Andrew J.
  • BOOTH, Brett C.
  • NIXON, Jason P.
  • WRIGHT, W. James
Priority Data
17/314,53507.05.2021US
63/199,87329.01.2021US
Publication Language English (en)
Filing Language English (EN)
Designated States
Title
(EN) LEAD FRAMES FOR SEMICONDUCTOR PACKAGES WITH INCREASED RELIABILITY AND RELATED PACKAGES AND METHODS
(FR) GRILLES DE CONNEXION POUR BOÎTIERS DE SEMI-CONDUCTEUR À FIABILITÉ ACCRUE ET BOÎTIERS AINSI QUE PROCÉDÉS ASSOCIÉS
Abstract
(EN) Lead frames for semiconductor device packages may include lead fingers proximate to a die-attach pad. A convex corner of the die-attach pad, or of the lead fingers proximate to a geometric center of the lead frame may be rounded to exhibit a radius of curvature of at least two times a greatest thickness of the die-attach pad, the thickness measured in a direction perpendicular to a major surface of the die-attach pad. A shortest distance between the die-attach pad and a largest of the lead fingers may be at least two times the greatest thickness of the die-attach pad.
(FR) Des grilles de connexion pour des boîtiers de dispositif à semi-conducteur peuvent comprendre des doigts de connexion à proximité d'une pastille de fixation de puce. Un coin convexe de la pastille de fixation de puce, ou des doigts de connexion à proximité d'un centre géométrique de la grille de connexion, peut être arrondi pour présenter un rayon de courbure d'au moins deux fois une épaisseur supérieure à celle de la pastille de fixation de puce, l'épaisseur étant mesurée dans une direction perpendiculaire à une surface principale de la pastille de fixation de puce. La distance la plus courte entre la pastille de fixation de puce et le plus grand des doigts de connexion peut être d'une épaisseur au moins deux fois la plus grande que celle de la pastille de fixation de puce.
Related patent documents
Latest bibliographic data on file with the International Bureau