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1. WO2022161629 - AN APPARATUS FOR TESTING A COMPONENT, A METHOD OF TESTING A COMPONENT, A COMPUTER PROGRAM FOR IMPLEMENTING THIS METHOD AND A TEST ARRANGEMENT USING A MAGNETIC FIELD

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Publication Number WO/2022/161629
Publication Date 04.08.2022
International Application No. PCT/EP2021/052188
International Filing Date 29.01.2021
IPC
G01R 31/319 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
317Testing of digital circuits
3181Functional testing
319Tester hardware, i.e. output processing circuits
G01R 31/3187 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
317Testing of digital circuits
3181Functional testing
3187Built-in tests
G01R 31/3185 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
317Testing of digital circuits
3181Functional testing
3185Reconfiguring for testing, e.g. LSSD, partitioning
G01R 33/02 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
02Measuring direction or magnitude of magnetic fields or magnetic flux
CPC
G01R 31/318533
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
317Testing of digital circuits
3181Functional testing
3185Reconfiguring for testing, e.g. LSSD, partitioning
318533using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
G01R 31/3187
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
317Testing of digital circuits
3181Functional testing
3187Built-in tests
G01R 31/31905
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
317Testing of digital circuits
3181Functional testing
319Tester hardware, i.e. output processing circuit
31903tester configuration
31905Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
G01R 33/1207
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
12Measuring magnetic properties of articles or specimens of solids or fluids
1207Testing individual magnetic storage devices, e.g. records carriers or digital storage elements
Applicants
  • ADVANTEST CORPORATION [JP]/[JP] (AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BE, BF, BG, BH, BJ, BN, BR, BW, BY, BZ, CA, CF, CG, CH, CI, CL, CM, CN, CO, CR, CU, CY, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, FR, GA, GB, GD, GE, GH, GM, GN, GQ, GR, GT, GW, HN, HR, HU, ID, IE, IL, IN, IR, IS, IT, JO, JP, KE, KG, KH, KM, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MC, MD, ME, MG, MK, ML, MN, MR, MT, MW, MX, MY, MZ, NA, NE, NG, NI, NL, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SI, SK, SL, SM, SN, ST, SV, SY, SZ, TD, TG, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, UZ, VC, VN, WS, ZA, ZM, ZW)
  • MIELKE, Frank [DE]/[DE] (US)
Inventors
  • MIELKE, Frank
Agents
  • BURGER, Markus
  • ZIMMERMANN, Tankred
  • STÖCKELER, Ferdinand
  • ZINKLER, Franz
  • SCHENK, Markus
  • HERSINA, Günter
  • SCHAIRER, Oliver
  • SCHLENKER, Julian
  • PFITZNER, Hannes
  • KÖNIG, Andreas
Priority Data
Publication Language English (en)
Filing Language English (EN)
Designated States
Title
(EN) AN APPARATUS FOR TESTING A COMPONENT, A METHOD OF TESTING A COMPONENT, A COMPUTER PROGRAM FOR IMPLEMENTING THIS METHOD AND A TEST ARRANGEMENT USING A MAGNETIC FIELD
(FR) APPAREIL POUR TESTER UN COMPOSANT, PROCÉDÉ DE TEST D'UN COMPOSANT, PROGRAMME INFORMATIQUE POUR LA MISE EN ŒUVRE DE CE PROCÉDÉ ET AGENCEMENT DE TEST UTILISANT UN CHAMP MAGNÉTIQUE
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Abstract
(EN) The invention describes an apparatus (100) for testing a component, wherein the apparatus (100) is configured to apply (101), for a set of B-field orientations, a magnetic B-field with a B-field orientation from the set of B-field orientations to the component; and wherein the apparatus (100) is configured to perform (102) a test of the component in the presence of the respective magnetic B-fields, to obtain an information characterizing an operation of the component; and wherein the apparatus (100) is configured to determine (103) a test result on the basis of the information characterizing the operation of the component associated with different magnetic B-fields. The invention also describes a method of testing and a computer program implementing the method. A test arrangement comprising the apparatus for testing is also described. This invention provides a testing concept, which is more efficient in view of the reliability and the costs.
(FR) L'invention concerne un appareil (100) pour tester un composant, l'appareil (100) étant conçu pour appliquer (101), pour un ensemble d'orientations de champ B, un champ B magnétique ayant une orientation de champ B à partir de l'ensemble d'orientations de champ B vers le composant ; et l'appareil (100) étant conçu pour effectuer (102) un test du composant en présence des champs B magnétiques respectifs, pour obtenir une information caractérisant une opération du composant ; et l'appareil (100) étant conçu pour déterminer (103) un résultat de test sur la base des informations caractérisant le fonctionnement du composant associé à différents champs B magnétiques. L'invention concerne également un procédé de test et un programme informatique mettant en œuvre le procédé. L'invention concerne aussi un agencement de test comprenant l'appareil de test. La présente invention concerne un concept de test, qui est plus efficace compte tenu de la fiabilité et des coûts.
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