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1. WO2022097893 - APPARATUS, SYSTEM, AND CONTROL METHOD FOR MEASURING LED PANEL

Publication Number WO/2022/097893
Publication Date 12.05.2022
International Application No. PCT/KR2021/012031
International Filing Date 06.09.2021
IPC
G09G 3/00 2006.1
GPHYSICS
09EDUCATING; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
3Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
G06N 3/08 2006.1
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
NCOMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
3Computer systems based on biological models
02using neural network models
08Learning methods
Applicants
  • 삼성전자주식회사 SAMSUNG ELECTRONICS CO., LTD. [KR]/[KR]
Inventors
  • 김광돈 KIM, Kwangdon
  • 박세한 PARK, Seihan
  • 곽재희 KWAK, Jaehee
  • 김찬열 KIM, Chanyul
  • 박두복 PARK, Dubok
  • 박철성 PARK, Cheolseong
  • 백상욱 BAEK, Sangwook
Agents
  • 김태헌 KIM, Tae-hun
  • 정홍식 JEONG, Hong-sik
Priority Data
10-2020-014776106.11.2020KR
Publication Language Korean (ko)
Filing Language Korean (KO)
Designated States
Title
(EN) APPARATUS, SYSTEM, AND CONTROL METHOD FOR MEASURING LED PANEL
(FR) APPAREIL, SYSTÈME ET PROCÉDÉ DE COMMANDE POUR MESURER UN PANNEAU À DEL
(KO) LED 패널 계측 장치, 시스템 및 제어 방법
Abstract
(EN) Disclosed are an apparatus, a system, and a control method for measuring an LED panel. The method for measuring an LED panel comprises the steps of: capturing an image of an LED panel displayed in a preset color; classifying each pixel of the LED panel from the captured image of the LED panel into pixel regions having different sizes according to a predetermined threshold brightness value; obtaining a tristimulus value of each pixel by using the data of the classified pixel regions and a trained artificial intelligence model; and obtaining the luminance and chrominance of each pixel on the basis of the obtained tristimulus value.
(FR) L'invention concerne un appareil, un système et un procédé de commande pour mesurer un panneau à DEL. Le procédé de mesure de panneau à DEL comprend les étapes consistant : à capturer une image d'un panneau à DEL affiché dans une couleur prédéfinie ; à classifier chaque pixel du panneau à DEL provenant de l'image capturée du panneau à DEL en régions de pixels de différentes tailles selon une valeur de luminosité de seuil prédéterminée ; à obtenir une valeur de tristimulus de chaque pixel à l'aide des données des régions de pixels classifiées et d'un modèle d'intelligence artificielle entraîné ; et à obtenir la luminance et la chrominance de chaque pixel sur la base de la valeur de tristimulus obtenue.
(KO) LED 패널 계측 장치, 시스템 및 제어 방법이 개시된다. LED 패널 계측 방법은 기 설정된 색상으로 디스플레이된 LED 패널의 이미지를 촬영하는 단계, 촬영된 LED 패널의 이미지에서 LED 패널의 각 픽셀을 기 설정된 임계 휘도 값에 따라 다른 크기의 픽셀 영역으로 구분하는 단계, 구분된 픽셀 영역의 데이터와 학습된 인공 지능 모델을 이용하여 각 픽셀의 삼색 자극 값(tristimulus value)을 획득하는 단계 및 획득된 삼색 자극 값에 기초하여 각 픽셀의 휘도 및 색도를 획득하는 단계를 포함한다.
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