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1. WO2022045489 - QUANTUM DOT BAND GAP CONTROL METHOD AND SYSTEM USING SAME

Publication Number WO/2022/045489
Publication Date 03.03.2022
International Application No. PCT/KR2020/018973
International Filing Date 23.12.2020
IPC
G01Q 30/02 2010.1
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
30Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
02Non-SPM analysing devices, e.g. SEM , spectrometer or optical microscope
G01J 3/44 2006.1
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3Spectrometry; Spectrophotometry; Monochromators; Measuring colours
28Investigating the spectrum
44Raman spectrometry; Scattering spectrometry
G01Q 10/00 2010.1
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
10Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
G01N 21/65 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63optically excited
65Raman scattering
G01N 21/66 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
66electrically excited, e.g. electroluminescence
CPC
G01J 3/44
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3Spectrometry; Spectrophotometry; Monochromators; Measuring colours
28Investigating the spectrum
44Raman spectrometry; Scattering spectrometry ; ; Fluorescence spectrometry
G01N 21/65
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63optically excited
65Raman scattering
G01N 21/66
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
66electrically excited, e.g. electroluminescence
G01Q 10/00
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
10Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
G01Q 30/02
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
30Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
02Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
Applicants
  • 울산과학기술원 UNIST(ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY) [KR]/[KR]
Inventors
  • 박경덕 PARK, Kyoung Duck
  • 이형우 LEE, Hyeong Woo
Agents
  • 특허법인 무한 MUHANN PATENT & LAW FIRM
Priority Data
10-2020-010694125.08.2020KR
Publication Language Korean (ko)
Filing Language Korean (KO)
Designated States
Title
(EN) QUANTUM DOT BAND GAP CONTROL METHOD AND SYSTEM USING SAME
(FR) PROCÉDÉ DE COMMANDE DE LARGEUR DE BANDE INTERDITE DE POINTS QUANTIQUES ET SYSTÈME L'UTILISANT
(KO) 양자점의 밴드갭 제어 방법 및 이를 이용한 시스템
Abstract
(EN) The present invention relates to a quantum dot band gap control method and a system using same, and more specifically, to a quantum dot band gap control method using a tip-enhanced nanospectromicroscope, and a system for single quantum dot band gap control and optical signal measuring, the method comprising the steps of: preparing a quantum dot-containing specimen on a substrate; irradiating light on the specimen; positioning a tip of a tip-enhanced nanospectromicroscope above the quantum dots of the specimen; and controlling a band gap by applying pressure to the quantum dots in the vertical direction by using the tip. In addition, the present invention relates to a method for measuring an optical signal of quantum dots using a tip-enhanced nanospectromicroscope.
(FR) La présente invention se rapporte à un procédé de commande de largeur de bande interdite de points quantiques et à un système l'utilisant, et plus particulièrement, à un procédé de commande largeur de bande interdite de points quantiques utilisant un nanospectromicroscope à pointe améliorée, et un système de commande de largeur de bande interdite de point quantique unique et de mesure de signal optique, le procédé consistant : à préparer un échantillon contenant des points quantiques sur un substrat ; à rayonner de la lumière sur l'échantillon ; à positionner une pointe d'un nanospectromicroscope à pointe améliorée au-dessus des points quantiques de l'échantillon ; et à commander une largeur de bande interdite par l'application d'une pression aux points quantiques dans la direction verticale à l'aide de la pointe. De plus, la présente invention concerne un procédé de mesure d'un signal optique de points quantiques à l'aide d'un nanospectromicroscope à pointe améliorée.
(KO) 본 발명은, 양자점의 밴드갭 제어 방법 및 이를 이용한 시스템에 관한 것으로, 보다 구체적으로, 기판 상에 양자점을 포함하는 시편을 준비하는 단계; 상기 시편에 광조사하는 단계; 상기 시편의 양자점 위로 탐침증강 나노분광현미경의 탐침을 위치시키는 단계; 및 상기 탐침을 이용하여 수직 방향으로 양자점에 압력을 가하여 밴드갭을 제어하는 단계; 를 포함하는, 탐침증강 나노분광현미경을 이용한, 양자점의 밴드갭 제어 방법 및 단일 양자점 밴드갭 제어 및 광신호 측정을 위한 시스템에 관한 것이다. 또한, 본 발명은, 탐침증강 나노분광현미경을 이용한, 양자점의 광신호 측정 방법에 관한 것이다.
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