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1. WO2022043440 - SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS

Publication Number WO/2022/043440
Publication Date 03.03.2022
International Application No. PCT/EP2021/073622
International Filing Date 26.08.2021
IPC
G01N 23/20008 2018.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
CPC
G01N 2223/056
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
05by diffraction, scatter or reflection
056diffraction
G01N 23/20008
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
Applicants
  • MALVERN PANALYTICAL B.V. [NL]/[NL]
Inventors
  • VUGTEVEN, Jan
  • GATESHKI, Milen
  • BECKERS, Detlef
Agents
  • ELKINGTON AND FIFE LLP
Priority Data
20192983.326.08.2020EP
Publication Language English (en)
Filing Language English (EN)
Designated States
Title
(EN) SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS
(FR) PORTE-ÉCHANTILLON POUR UN APPAREIL D'ANALYSE AUX RAYONS X
Abstract
(EN) The present invention relates to sample holder for holding a sample. The sample holder comprises a body having an incident surface and an opening in the body for receiving a sample. When the sample is irradiated with X-rays the incident surface of the sample holder may also be irradiated, especially at low incident angles. To reduce background scattering from the incident surface, the incident surface comprises a protrusion for blocking X-rays.
(FR) La présente invention concerne un porte-échantillon pour retenir un échantillon. Le porte-échantillon comprend un corps présentant une surface incidente et une ouverture dans le corps pour recevoir un échantillon. Lorsque l'échantillon est irradié par des rayons X, la surface incidente du porte-échantillon peut également être irradiée, en particulier à des angles d'incidence faibles. Pour réduire la diffusion de fond à partir de la surface incidente, la surface incidente comprend une saillie pour bloquer les rayons X.
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