WO2022043440 SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS

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Publication Number WO/2022/043440

Publication Date 03.03.2022

International Application No. PCT/EP2021/073622

International Filing Date 26.08.2021

IPC

CPC

Applicants

MALVERN PANALYTICAL B.V. [NL]/[NL]

Inventors

VUGTEVEN, Jan
GATESHKI, Milen
BECKERS, Detlef

Agents

ELKINGTON AND FIFE LLP

Priority Data

20192983.3

26.08.2020

Publication Language English (en)

Filing Language English (EN)

Designated States

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Title

(EN) SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS

(FR) PORTE-ÉCHANTILLON POUR UN APPAREIL D'ANALYSE AUX RAYONS X

Abstract

(EN) The present invention relates to sample holder for holding a sample. The sample holder comprises a body having an incident surface and an opening in the body for receiving a sample. When the sample is irradiated with X-rays the incident surface of the sample holder may also be irradiated, especially at low incident angles. To reduce background scattering from the incident surface, the incident surface comprises a protrusion for blocking X-rays.

(FR) La présente invention concerne un porte-échantillon pour retenir un échantillon. Le porte-échantillon comprend un corps présentant une surface incidente et une ouverture dans le corps pour recevoir un échantillon. Lorsque l'échantillon est irradié par des rayons X, la surface incidente du porte-échantillon peut également être irradiée, en particulier à des angles d'incidence faibles. Pour réduire la diffusion de fond à partir de la surface incidente, la surface incidente comprend une saillie pour bloquer les rayons X.

G	PHYSICS
01	MEASURING; TESTING
N	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23	Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20	by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008	Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor

G	PHYSICS
01	MEASURING; TESTING
N	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23	Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20	by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008	Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor

G	PHYSICS
01	MEASURING; TESTING
N	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223	Investigating materials by wave or particle radiation
05	by diffraction, scatter or reflection
056	diffraction

G	PHYSICS
01	MEASURING; TESTING
N	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23	Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
20	by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008	Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor

G	PHYSICS
01	MEASURING; TESTING
N	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223	Investigating materials by wave or particle radiation
05	by diffraction, scatter or reflection
056	diffraction

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1. WO2022043440 - SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS