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1. WO2022006301 - DATA GENERATION METHOD FOR REGRESSION MODELS FOR CIRCUIT ELEMENT VALUE DETERMINATION

Publication Number WO/2022/006301
Publication Date 06.01.2022
International Application No. PCT/US2021/039937
International Filing Date 30.06.2021
IPC
G01R 31/08 2020.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
08Locating faults in cables, transmission lines, or networks
G01R 31/14 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
12Testing dielectric strength or breakdown voltage
14Circuits therefor
G01R 31/52 2020.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
52Testing for short-circuits, leakage current or ground faults
G01R 31/50 2020.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Applicants
  • KIM, Charles [US]/[US]
Inventors
  • KIM, Charles
Agents
  • TAKAGI, Keiko K.
  • RABENA, John F.
  • CROCKETT, Douglas
Priority Data
63/046,26430.06.2020US
Publication Language English (en)
Filing Language English (EN)
Designated States
Title
(EN) DATA GENERATION METHOD FOR REGRESSION MODELS FOR CIRCUIT ELEMENT VALUE DETERMINATION
(FR) PROCÉDÉ DE GÉNÉRATION DE DONNÉES DE MODÈLES DE RÉGRESSION À DES FINS DE DÉTERMINATION DE VALEUR D'ÉLÉMENT DE CIRCUIT
Abstract
(EN) A method, computer program, and computer system is provided for fault detection in an electrical network. An inductance between a reference point and a fault is determined at a first time based on measuring a fault current. A resistance between the reference point and the fault may be determined at a second time based on measuring a differential of the fault current as zero. A location of the fault may be identified based on the inductance and the resistance.
(FR) L'invention concerne un procédé, un programme informatique et un système informatique de détection de défaut dans un réseau électrique. Une inductance entre un point de référence et un défaut est déterminée à un premier instant sur la base d'une mesure d'un courant de défaut. Une résistance entre le point de référence et le défaut peut être déterminée à un second instant sur la base d'une mesure d'un différentiel du courant de défaut en tant que valeur nulle. Un emplacement du défaut peut être identifié sur la base de l'inductance et de la résistance.
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