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1. WO2022005093 - X-RAY IMAGE-BASED FOREIGN MATERIAL DETECTION PERFORMANCE OPTIMIZATION SYSTEM AND METHOD

Publication Number WO/2022/005093
Publication Date 06.01.2022
International Application No. PCT/KR2021/007873
International Filing Date 23.06.2021
IPC
G01N 23/04 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
02by transmitting the radiation through the material
04and forming images of the material
G01N 23/10 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
02by transmitting the radiation through the material
06and measuring the absorption
10the material being confined in a container, e.g. in luggage X-ray scanners
G01N 23/18 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
02by transmitting the radiation through the material
06and measuring the absorption
18Investigating the presence of defects or foreign matter
G01N 23/083 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
02by transmitting the radiation through the material
06and measuring the absorption
083the radiation being X-rays
Applicants
  • (주) 넥스트랩 NEXTLAB CO., LTD. [KR]/[KR]
Inventors
  • 박영수 PARK, Young Su
  • 이세용 LEE, Se Yong
  • 이지웅 LEE, Ji Woong
  • 손호준 SON, Ho Joon
  • 김성민 KIM, Sung Min
Agents
  • 수안특허법인 SUAN INTELLECTUAL PROPERTY
Priority Data
10-2020-008019830.06.2020KR
Publication Language Korean (ko)
Filing Language Korean (KO)
Designated States
Title
(EN) X-RAY IMAGE-BASED FOREIGN MATERIAL DETECTION PERFORMANCE OPTIMIZATION SYSTEM AND METHOD
(FR) SYSTÈME ET PROCÉDÉ D'OPTIMISATION DE PERFORMANCES DE DÉTECTION DE MATIÈRE ÉTRANGÈRE BASÉS SUR DES IMAGES À RAYONS X
(KO) 엑스레이 이미지 기반 이물질 탐지 성능 최적화 시스템 및 방법
Abstract
(EN) An X-ray image-based foreign material detection performance optimization system, according to one embodiment of the present invention, comprises: an initial data acquiring unit for acquiring a plurality of X-ray images (raw images) of a product to be inspected mixed with foreign materials; an operation executing unit for performing an operation to change settings for a plurality of foreign material detection algorithms; and an analyzing unit for analyzing the X-ray images by using the foreign material detection algorithms of which the settings were changed, outputting a foreign material detection result on the basis of the analysis result of the X-ray images, evaluating the foreign material detection result, and deriving an optimal set value for the foreign material detection algorithms.
(FR) Selon un mode de réalisation, la présente invention concerne un système d'optimisation de performances de détection de matière étrangère basé sur des images à rayons X comprenant : une unité d'acquisition de données initiales pour acquérir une pluralité d'images à rayons X (images brutes) d'un produit à inspecter mélangé à des matières étrangères ; une unité d'exécution d'opération pour exécuter une opération consistant à modifier des réglages pour une pluralité d'algorithmes de détection de matière étrangère ; et une unité d'analyse pour analyser les images à rayons X à l'aide des algorithmes de détection de matière étrangère dont les réglages ont été modifiés, émettre un résultat de détection de matière étrangère sur la base du résultat d'analyse des images à rayons X, évaluer le résultat de détection de matière étrangère, et dériver une valeur de consigne optimale pour les algorithmes de détection de matière étrangère.
(KO) 본 발명의 일 실시예에 따른 엑스레이 이미지 기반 이물질 탐지 성능 최적화 시스템은 이물질이 혼입된 검사 대상 제품에 대한 복수의 엑스레이 이미지(Raw Image)를 획득하는 초기 데이터 획득부; 복수의 이물탐지 알고리즘에 대하여 설정 변경을 하는 연산을 수행하는 연산 수행부; 및 상기 설정 변경된 이물탐지 알고리즘을 이용하여 상기 엑스레이 이미지를 분석하고, 상기 엑스레이 이미지의 분석 결과에 기초하여 이물탐지 결과를 출력하며, 상기 이물탐지 결과를 평가하여 상기 이물탐지 알고리즘에 관한 최적의 설정값을 도출하는 분석부를 포함한다.
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