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1. WO2022001440 - FLAT PANEL DETECTOR AND FABRICATION METHOD THEREFOR

Publication Number WO/2022/001440
Publication Date 06.01.2022
International Application No. PCT/CN2021/094474
International Filing Date 19.05.2021
IPC
G01N 23/04 2018.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
02by transmitting the radiation through the material
04and forming images of the material
G01T 1/20 2006.1
GPHYSICS
01MEASURING; TESTING
TMEASUREMENT OF NUCLEAR OR X-RADIATION
1Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
16Measuring radiation intensity
20with scintillation detectors
CPC
A61B 6/00
AHUMAN NECESSITIES
61MEDICAL OR VETERINARY SCIENCE; HYGIENE
BDIAGNOSIS; SURGERY; IDENTIFICATION
6Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
A61B 6/4208
AHUMAN NECESSITIES
61MEDICAL OR VETERINARY SCIENCE; HYGIENE
BDIAGNOSIS; SURGERY; IDENTIFICATION
6Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
42with arrangements for detecting radiation specially adapted for radiation diagnosis
4208characterised by using a particular type of detector
A61B 6/4258
AHUMAN NECESSITIES
61MEDICAL OR VETERINARY SCIENCE; HYGIENE
BDIAGNOSIS; SURGERY; IDENTIFICATION
6Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
42with arrangements for detecting radiation specially adapted for radiation diagnosis
4208characterised by using a particular type of detector
4258for detecting non x-ray radiation, e.g. gamma radiation
G01N 2223/03
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
03by transmission
G01N 2223/42
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
40Imaging
42image digitised, -enhanced in an image processor
G01N 2223/501
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
50Detectors
501array
Applicants
  • 京东方科技集团股份有限公司 BOE TECHNOLOGY GROUP CO., LTD. [CN]/[CN]
  • 北京京东方传感技术有限公司 BEIJING BOE SENSOR TECHNOLOGY CO., LTD. [CN]/[CN]
Inventors
  • 尚建兴 SHANG, Jianxing
  • 侯学成 HOU, Xuecheng
  • 张永胜 ZHANG, Yongsheng
Agents
  • 北京市柳沈律师事务所 LIU, SHEN & ASSOCIATES
Priority Data
202010607415.029.06.2020CN
Publication Language Chinese (zh)
Filing Language Chinese (ZH)
Designated States
Title
(EN) FLAT PANEL DETECTOR AND FABRICATION METHOD THEREFOR
(FR) DÉTECTEUR À PANNEAU PLAT ET SON PROCÉDÉ DE FABRICATION
(ZH) 平板探测器及其制造方法
Abstract
(EN) Disclosed are a flat panel detector and a fabrication method therefor. The flat panel detector comprises a first optical assembly, and the first optical assembly has a first side and a second side along the thickness direction of the flat panel detector and comprises: a first scintillator layer, for converting at least a portion of rays into first visible light, and a first light conducting structure stacked with the first scintillator layer and used for conducting the first visible light. The flat panel detector further comprises a first image sensor assembly, stacked with the first optical assembly and used for receiving the first visible light. The first image sensor assembly comprises a first image sensor and a second image sensor which are disposed on the first side and the second side of the first optical assembly, respectively. By providing the second image sensor, a portion of the first visible light emitted from an upper surface of the first scintillator layer is able to reach the second image sensor for imaging, thus avoiding the loss of the first visible light due to propagation within the first scintillator layer.
(FR) Sont divulgués un détecteur à panneau plat et son procédé de fabrication. Le détecteur à panneau plat comprend un premier ensemble optique et le premier ensemble optique a un premier côté et un second côté le long de la direction de l'épaisseur du détecteur à panneau plat et comprend : une première couche de scintillateur pour convertir au moins une portion de rayons en une première lumière visible et une première structure conductrice de lumière empilée avec la première couche de scintillateur et utilisée pour conduire la première lumière visible. Le détecteur à panneau plat comprend en outre un premier ensemble capteur d'image, empilé avec le premier ensemble optique et utilisé pour recevoir la première lumière visible. Le premier ensemble capteur d'image comprend un premier capteur d'image et un second capteur d'image qui sont respectivement disposés sur le premier côté et le second côté du premier ensemble optique. Grâce à la fourniture du second capteur d'image, une portion de la première lumière visible émise à partir d'une surface supérieure de la première couche de scintillateur peut atteindre le second capteur d'image pour une imagerie, ce qui permet d'éviter la perte de la première lumière visible due à la propagation à l'intérieur de la première couche de scintillateur.
(ZH) 公开了一种平板探测器及其制造方法。该平板探测器包括第一光学组件,所述第一光学组件具有沿所述平板探测器的厚度方向的第一侧和第二侧并且包括:第一闪烁体层,用于将至少部分射线转化为第一可见光和第一光传导结构,与所述第一闪烁体层堆叠,用于传导所述第一可见光。该平板探测器还包括第一图像传感器组件,与所述第一光学组件堆叠,用于接收所述第一可见光,所述第一图像传感器组件包括:分别位于所述第一光学组件的所述第一侧和所述第二侧的第一图像传感器和第二图像传感器。通过设置第二图像传感器,使从第一闪烁体层的上表面出射的部分第一可见光能够抵达第二图像传感器成像,避免了第一可见光在第一闪烁体层内传播导致的损失。
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