Processing

Please wait...

PATENTSCOPE will be unavailable a few hours for maintenance reason on Tuesday 25.01.2022 at 9:00 AM CET
Settings

Settings

Goto Application

1. WO2021246021 - SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD

Publication Number WO/2021/246021
Publication Date 09.12.2021
International Application No. PCT/JP2021/010879
International Filing Date 17.03.2021
IPC
G02B 21/06 2006.1
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
06Means for illuminating specimen
G01N 21/64 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63optically excited
64Fluorescence; Phosphorescence
CPC
G01N 21/64
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63optically excited
64Fluorescence; Phosphorescence
G02B 21/06
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
06Means for illuminating specimens
Applicants
  • 浜松ホトニクス株式会社 HAMAMATSU PHOTONICS K.K. [JP]/[JP]
Inventors
  • 山本 諭 YAMAMOTO Satoshi
Agents
  • 長谷川 芳樹 HASEGAWA Yoshiki
  • 黒木 義樹 KUROKI Yoshiki
  • 柴山 健一 SHIBAYAMA Kenichi
Priority Data
2020-09550801.06.2020JP
Publication Language Japanese (ja)
Filing Language Japanese (JA)
Designated States
Title
(EN) SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD
(FR) DISPOSITIF ET PROCÉDÉ D'OBSERVATION D'ÉCHANTILLON
(JA) 試料観察装置及び試料観察方法
Abstract
(EN) In this sample observation device 1, the scanning speed of a scanning part 4 and the optimal light quantity of planar light L2 with which a sample S is irradiated are determined on the basis of a measurement sensitivity selected by a user, with reference to a reference table 41 in which the optimal light quantity of the planar light L2 at a measurement sensitivity represented by the product of the light quantity of the planar light L2 and the scanning speed is set in accordance with the scanning speed.
(FR) Dans le dispositif d'observation d'échantillon (1) de la présente invention, la vitesse de balayage d'une partie de balayage (4) et la quantité de lumière optimale de lumière plane (L2) avec laquelle un échantillon S est irradié sont déterminées sur la base d'une sensibilité de mesure sélectionnée par un utilisateur, en référence à une table de référence (41) dans laquelle la quantité de lumière optimale de la lumière plane (L2) à une sensibilité de mesure représentée par le produit de la quantité de lumière de la lumière plane (L2) et la vitesse de balayage est réglée en fonction de la vitesse de balayage.
(JA) この試料観察装置1では、面状光L2の光量と走査速度との積で表される測定感度における面状光L2の最適光量が走査速度に応じて設定された参照テーブル41を参照し、ユーザによって選択された測定感度に基づいて走査部4の走査速度と試料Sに照射される面状光L2の最適光量とを決定する。
Latest bibliographic data on file with the International Bureau