Processing

Please wait...

Settings

Settings

Goto Application

1. WO2021233817 - SCANNING PROBE MICROSCOPE (SPM) TIP

Publication Number WO/2021/233817
Publication Date 25.11.2021
International Application No. PCT/EP2021/062967
International Filing Date 17.05.2021
IPC
G01Q 70/18 2010.1
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
70General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/196
16Probe manufacture
18Functionalisation
G01Q 70/14 2010.1
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
70General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/196
08Probe characteristics
14Particular materials
G01Q 60/06 2010.1
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
02Multiple-type SPM, i.e. involving two or more SPM techniques
06SNOM combined with AFM
G01Q 70/12 2010.1
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
70General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/196
08Probe characteristics
10Shape or taper
12Nanotube tips
Applicants
  • NEXT-TIP, S.L. [ES]/[ES]
Inventors
  • SANZ SANZ, Belén
  • ESPINOSA RODRÍGUEZ, Manuel
Agents
  • ABG INTELLECTUAL PROPERTY LAW, S.L.
Priority Data
20382415.618.05.2020EP
Publication Language English (en)
Filing Language English (EN)
Designated States
Title
(EN) SCANNING PROBE MICROSCOPE (SPM) TIP
(FR) POINTE DE MICROSCOPE À SONDE DE BALAYAGE (SPM)
Abstract
(EN) The present invention refers to a method for modifying a scanning probe microscope (SPM) tip, a modified SPM tip obtainable by the method, a modified SPM tip, to the use of the modified SPM tip, to a scanning probe comprising the modified SPM tip and to the use of the scanning probe.
(FR) La présente invention concerne un procédé de modification d'une pointe de microscope à sonde de balayage (SPM), une pointe de SPM modifiée pouvant être obtenue par le procédé, une pointe de SPM modifiée, l'utilisation de la pointe de SPM modifiée, une sonde de balayage comprenant la pointe de SPM modifiée et l'utilisation de la sonde de balayage.
Latest bibliographic data on file with the International Bureau