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1. WO2021053033 - MAGNETORESISTIVE STACK WITHOUT RADIATED FIELD, SENSOR AND MAGNETIC MAPPING SYSTEM COMPRISING SUCH A STACK

Publication Number WO/2021/053033
Publication Date 25.03.2021
International Application No. PCT/EP2020/075896
International Filing Date 16.09.2020
IPC
G01R 33/09 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
02Measuring direction or magnitude of magnetic fields or magnetic flux
06using galvano-magnetic devices
09Magneto-resistive devices
G01Q 60/38 2010.1
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
24AFM or apparatus therefor, e.g. AFM probes
38Probes, their manufacture or their related instrumentation, e.g. holders
G01R 33/12 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
12Measuring magnetic properties of articles or specimens of solids or fluids
G01R 33/16 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
12Measuring magnetic properties of articles or specimens of solids or fluids
16Measuring susceptibility
G01R 33/14 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
12Measuring magnetic properties of articles or specimens of solids or fluids
14Measuring or plotting hysteresis curves
CPC
G01Q 60/54
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
50MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes
54Probes, their manufacture, or their related instrumentation, e.g. holders
G01R 33/093
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
02Measuring direction or magnitude of magnetic fields or magnetic flux
06using galvano-magnetic devices, e.g. Hall effect devices; using magneto-resistive devices
09Magnetoresistive devices
093using multilayer structures, e.g. giant magnetoresistance sensors
G01R 33/098
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
02Measuring direction or magnitude of magnetic fields or magnetic flux
06using galvano-magnetic devices, e.g. Hall effect devices; using magneto-resistive devices
09Magnetoresistive devices
098comprising tunnel junctions, e.g. tunnel magnetoresistance sensors
G01R 33/1215
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
12Measuring magnetic properties of articles or specimens of solids or fluids
1215Measuring magnetisation; Particular magnetometers therefor
G01R 33/14
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
12Measuring magnetic properties of articles or specimens of solids or fluids
14Measuring or plotting hysteresis curves
G01R 33/16
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33Arrangements or instruments for measuring magnetic variables
12Measuring magnetic properties of articles or specimens of solids or fluids
16Measuring susceptibility
Applicants
  • COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES [FR]/[FR]
Inventors
  • FERMON, Claude
  • SOLIGNAC, Aurélie
  • PANNETIER-LECOEUR, Myriam
Agents
  • LEBKIRI, Alexandre
Priority Data
FR191031719.09.2019FR
Publication Language French (fr)
Filing Language French (FR)
Designated States
Title
(EN) MAGNETORESISTIVE STACK WITHOUT RADIATED FIELD, SENSOR AND MAGNETIC MAPPING SYSTEM COMPRISING SUCH A STACK
(FR) EMPILEMENT MAGNÉTORÉSISTIF SANS CHAMP RAYONNÉ, CAPTEUR ET SYSTÈME DE CARTOGRAPHIE MAGNÉTIQUE COMPRENANT UN TEL EMPILEMENT
Abstract
(EN) One aspect of the invention relates to a magnetoresistive stack (1) comprising: - a reference layer (2) comprising: • a magnetic layer (21), • an antiferromagnetic layer (24) in exchange coupling with the magnetic layer (21), • a magnetic layer (22) substantially of the same magnetization as the magnetic layer (21), • a spacer layer (23) between the magnetic layers (21, 22) with a thickness for enabling an antiferromagnetic coupling between the magnetic layers (21, 22) of a first coupling intensity, - a free layer (3) having a coercivity of less than 10 microTesla, the free layer (3) comprising: • a magnetic layer (32), • an antiferromagnetic layer (34) in exchange coupling with the magnetic layer (32), • a magnetic layer (31) substantially of the same magnetization as the magnetic layer (32), • a spacer layer (33) between the magnetic layers (31, 32) with a thickness for enabling an antiferromagnetic coupling between the magnetic layers of a second coupling intensity lower than the first coupling intensity, - a third spacer layer (4) separating the reference layer (2) and the free layer (3).
(FR) Un aspect de l'invention concerne un empilement magnétorésistif (1) comprenant : - Une couche de référence (2) comprenant : • Une couche magnétique (21), • Une couche antiferromagnétique (24) en couplage d'échange avec la couche magnétique (21), • Une couche magnétique (22) sensiblement de même aimantation que la couche magnétique (21), • Une couche espaceur (23) entre les couches magnétiques (21, 22) d'épaisseur permettant un couplage antiferromagnétique entre les couches magnétiques (21, 22) d'une première intensité de couplage, - Une couche libre (3) de coercivité inférieure à 10 microTesla, la couche libre (3) comprenant : • Une couche magnétique (32), • Une couche antiferromagnétique (34) en couplage d'échange avec la couche magnétique (32), • Une couche magnétique (31) sensiblement de même aimantation que la couche magnétique (32), • Une couche espaceur (33) entre les couches magnétiques (31, 32) d'épaisseur permettant un couplage antiferromagnétique entre les couches magnétiques d'une deuxième intensité de couplage inférieure à la première intensité de couplage, - Une troisième couche espaceur (4) séparant la couche de référence (2) et la couche libre (3).
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