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1. WO2021041019 - POWER MANAGEMENT IN SEMICONDUCTOR MEMORIES

Publication Number WO/2021/041019
Publication Date 04.03.2021
International Application No. PCT/US2020/045710
International Filing Date 11.08.2020
IPC
G11C 16/30 2006.01
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
16Erasable programmable read-only memories
02electrically programmable
06Auxiliary circuits, e.g. for writing into memory
30Power supply circuits
G11C 5/14 2006.01
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
5Details of stores covered by group G11C11/63
14Power supply arrangements
G06F 1/3206 2019.01
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
FELECTRIC DIGITAL DATA PROCESSING
1Details not covered by groups G06F3/-G06F13/82
26Power supply means, e.g. regulation thereof
32Means for saving power
3203Power management, i.e. event-based initiation of a power-saving mode
3206Monitoring of events, devices or parameters that trigger a change in power modality
G06F 1/329 2019.01
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
FELECTRIC DIGITAL DATA PROCESSING
1Details not covered by groups G06F3/-G06F13/82
26Power supply means, e.g. regulation thereof
32Means for saving power
3203Power management, i.e. event-based initiation of a power-saving mode
3234Power saving characterised by the action undertaken
329by task scheduling
CPC
G06F 1/28
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
FELECTRIC DIGITAL DATA PROCESSING
1Details not covered by groups G06F3/00G06F13/00 and G06F21/00
26Power supply means, e.g. regulation thereof
28Supervision thereof, e.g. detecting power-supply failure by out of limits supervision
G06F 1/305
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
FELECTRIC DIGITAL DATA PROCESSING
1Details not covered by groups G06F3/00G06F13/00 and G06F21/00
26Power supply means, e.g. regulation thereof
30Means for acting in the event of power-supply failure or interruption, e.g. power-supply fluctuations
305in the event of power-supply fluctuations
G06F 1/3225
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
FELECTRIC DIGITAL DATA PROCESSING
1Details not covered by groups G06F3/00G06F13/00 and G06F21/00
26Power supply means, e.g. regulation thereof
32Means for saving power
3203Power management, i.e. event-based initiation of power-saving mode
3206Monitoring of events, devices or parameters that trigger a change in power modality
3215Monitoring of peripheral devices
3225of memory devices
G06F 1/324
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
FELECTRIC DIGITAL DATA PROCESSING
1Details not covered by groups G06F3/00G06F13/00 and G06F21/00
26Power supply means, e.g. regulation thereof
32Means for saving power
3203Power management, i.e. event-based initiation of power-saving mode
3234Power saving characterised by the action undertaken
324by lowering clock frequency
G06F 1/3275
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
FELECTRIC DIGITAL DATA PROCESSING
1Details not covered by groups G06F3/00G06F13/00 and G06F21/00
26Power supply means, e.g. regulation thereof
32Means for saving power
3203Power management, i.e. event-based initiation of power-saving mode
3234Power saving characterised by the action undertaken
325Power saving in peripheral device
3275Power saving in memory, e.g. RAM, cache
G11C 16/30
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
16Erasable programmable read-only memories
02electrically programmable
06Auxiliary circuits, e.g. for writing into memory
30Power supply circuits
Applicants
  • MICRON TECHNOLOGY, INC. [US]/[US]
Inventors
  • GUO, Xiaojiang
Agents
  • LEFFERT, Thomas W.
  • PETERSON, Mark A.
Priority Data
16/548,91023.08.2019US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) POWER MANAGEMENT IN SEMICONDUCTOR MEMORIES
(FR) GESTION DE PUISSANCE DANS DES MÉMOIRES À SEMI-CONDUCTEURS
Abstract
(EN)
Methods of operating a die might include determining an expected peak current magnitude of the die for a period of time, and outputting the expected peak current magnitude from the die prior to completion of the period of time. Apparatus might be configured to perform similar methods.
(FR)
Des procédés de fonctionnement d'une puce peuvent comprendre les étapes suivantes consistant à : déterminer une amplitude de courant de crête attendue de la puce pendant une période de temps, et délivrer en sortie l'amplitude de courant de crête attendue à partir de la puce avant l'achèvement de la période de temps. L'appareil peut être configuré pour effectuer des procédés similaires.
Also published as
Latest bibliographic data on file with the International Bureau