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1. WO2020222327 - PIN FOR TESTING MICROELECTRODE CIRCUIT

Publication Number WO/2020/222327
Publication Date 05.11.2020
International Application No. PCT/KR2019/005201
International Filing Date 30.04.2019
IPC
G01R 1/067 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
G01R 1/073 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
073Multiple probes
G01R 31/28 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
Applicants
  • (주)위드멤스 WITHMEMS CO., LTD. [KR]/[KR]
Inventors
  • 구황섭 KOO, Hwang Sub
  • 윤기상 YUN, Ki Sang
  • 방호섭 BANG, Ho Sub
  • 정학섭 JEONG, Hag Seob
  • 이종한 LEE, Jong Han
  • 유석환 YOO, Seok Hwan
  • 백종율 BACK, Jong Yul
Agents
  • 특허법인 엠에이피에스 MAPS INTELLECTUAL PROPERTY LAW FIRM
Priority Data
Publication Language Korean (KO)
Filing Language Korean (KO)
Designated States
Title
(EN) PIN FOR TESTING MICROELECTRODE CIRCUIT
(FR) BROCHE DE TEST D'UN CIRCUIT DE MICROÉLECTRODES
(KO) 미세 전극 회로 검사용 핀
Abstract
(EN)
A pin for testing a microelectrode circuit according to the present invention comprises: a pin having a pair of contact portions formed at both ends thereof and an elastic portion formed to connect the both ends with an elastic restoring force; and a housing having a through portion exposing the contact portions to the outside and formed so as to cover the elastic portion, wherein the elastic portion comprises: a coupling portion connected to the housing; a plurality of bent portions extending in a serpentine shape and connected repeatedly to each other toward the both ends from the coupling portion; and a support portion formed on the surfaces of the serpentine portions such that the bent portions are supported in a direction toward the both ends when adjacent serpentine portions contact each other.
(FR)
La présente invention concerne une broche de test d'un circuit de microélectrodes comprenant : une broche possédant une paire de parties de contact formées à ses deux extrémités et une partie élastique formée de façon à relier les deux extrémités à une force de rappel élastique ; et un boîtier comprenant une partie traversante exposant les parties de contact à l'extérieur et formée de manière à recouvrir la partie élastique, la partie élastique comprenant : une partie de couplage reliée au boîtier ; une pluralité de parties courbées s'étendant en forme de serpentin et reliées de façon répétée l'une à l'autre vers les deux extrémités depuis la partie de couplage ; et une partie de maintien formée sur les surfaces des parties en serpentin de telle sorte que les parties courbées soient maintenues dans une direction vers les deux extrémités lorsque des parties en serpentin adjacentes viennent en contact l'une avec l'autre.
(KO)
본 발명에 따른 미세 전극 회로 검사용 핀은, 양 단에 형성되는 한 쌍의 접촉부와, 탄성 복원력을 가지고 상기 양 단 사이를 연결하도록 형성되는 탄성부를 구비하는 핀; 및 상기 접촉부를 외부로 노출시키는 관통부를 구비하고, 상기 탄성부를 덮도록 형성되는 하우징을 포함하며, 상기 탄성부는, 상기 하우징과 연결되는 결합부; 굴곡된 형상으로 연장되고, 상기 결합부로부터 상기 양 단을 향하여 반복되도록 연결되는 복수 개의 굴곡부; 및 서로 이웃한 상기 굴곡부의 상호 접촉 시 상기 양 단을 향하는 방향으로 지지되도록 상기 굴곡부의 표면에 형성되는 지지부를 구비한다.
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