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1. WO2020222094 - INDIRECT BANDGAP, PEROVSKITE-BASED X-RAY DETECTOR AND METHOD

Publication Number WO/2020/222094
Publication Date 05.11.2020
International Application No. PCT/IB2020/053868
International Filing Date 23.04.2020
IPC
H01L 31/08 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
31Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
08in which radiation controls flow of current through the device, e.g. photoresistors
G01T 1/20 2006.01
GPHYSICS
01MEASURING; TESTING
TMEASUREMENT OF NUCLEAR OR X-RADIATION
1Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
16Measuring radiation intensity
20with scintillation detectors
G01T 1/24 2006.01
GPHYSICS
01MEASURING; TESTING
TMEASUREMENT OF NUCLEAR OR X-RADIATION
1Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
16Measuring radiation intensity
24with semiconductor detectors
H01L 27/30 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
28including components using organic materials as the active part, or using a combination of organic materials with other materials as the active part
30with components specially adapted for sensing infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation; with components specially adapted for either the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
H01L 51/00 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
51Solid state devices using organic materials as the active part, or using a combination of organic materials with other materials as the active part; Processes or apparatus specially adapted for the manufacture or treatment of such devices, or of parts thereof
H01L 51/44 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
51Solid state devices using organic materials as the active part, or using a combination of organic materials with other materials as the active part; Processes or apparatus specially adapted for the manufacture or treatment of such devices, or of parts thereof
42specially adapted for sensing infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation; specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
44Details of devices
CPC
G01T 1/24
GPHYSICS
01MEASURING; TESTING
TMEASUREMENT OF NUCLEAR OR X-RADIATION
1Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
16Measuring radiation intensity
24with semiconductor detectors
H01L 27/308
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
28including components using organic materials as the active part, or using a combination of organic materials with other materials as the active part
30with components specially adapted for sensing infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation; with components specially adapted for either the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
305Devices controlled by radiation
308Devices specially adapted for detecting X-ray radiation
H01L 31/085
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
31Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
08in which radiation controls flow of current through the device, e.g. photoresistors
085the device being sensitive to very short wavelength, e.g. X-ray, Gamma-rays
Applicants
  • KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY [SA]/[SA]
Inventors
  • XIN, Bin
  • ROQAN, Iman S.
Priority Data
62/839,87829.04.2019US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) INDIRECT BANDGAP, PEROVSKITE-BASED X-RAY DETECTOR AND METHOD
(FR) DÉTECTEUR DE RAYONS X, À BANDE INTERDITE INDIRECTE, À BASE DE PÉROVSKITE ET PROCÉDÉ ASSOCIÉ
Abstract
(EN)
An X-ray system (1400) includes an X-ray generation unit (1410) configured to generate X-rays (1418); an X-ray detection unit (1420) including at least one X-ray sensor (1000) that includes an indirect bandgap, perovskite semiconductor material (1010), the X-ray sensor being configured to record the X-rays (1418); and a control unit (1430) that controls a generation of the X-rays (1418) and a detection of the X-rays (1418) at the X-ray detection unit (1420).
(FR)
La présente invention concerne un système (1400) à rayons X qui comprend une unité de production de rayons X (1410) conçue pour produire des rayons X (1418) ; une unité de détection de rayons X (1420) comprenant au moins un capteur (1000) de rayons X qui comprend une bande interdite indirecte, un matériau semi-conducteur à base de pérovskite (1010), le capteur de rayons X étant conçu pour enregistrer les rayons X (1418) ; et une unité de commande (1430) qui commande une production des rayons X (1418) et une détection des rayons X (1418) au niveau de l'unité de détection de rayons X (1420).
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