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1. WO2020220577 - TERAHERTZ SPECTRUM MEASUREMENT SYSTEM AND METHOD FOR ANALYZING TERAHERTZ SPECTRUM OF SUBSTANCE

Publication Number WO/2020/220577
Publication Date 05.11.2020
International Application No. PCT/CN2019/109380
International Filing Date 30.09.2019
IPC
G01N 21/3581 2014.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
35using infra-red light
3581using far infra-red light; using Terahertz radiation
CPC
G01N 2021/0112
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
01Arrangements or apparatus for facilitating the optical investigation
0106General arrangement of respective parts
0112Apparatus in one mechanical, optical or electronic block
G01N 2021/3129
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
3129Determining multicomponents by multiwavelength light
G01N 2021/396
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
39using tunable lasers
396Type of laser source
G01N 21/01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
01Arrangements or apparatus for facilitating the optical investigation
G01N 21/3581
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
35using infra-red light
3581using far infra-red light; using Terahertz radiation
G01N 21/39
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
39using tunable lasers
Applicants
  • 中国科学院上海微系统与信息技术研究所 SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY OF SCIENCES [CN]/[CN]
Inventors
  • 黎华 LI, Hua
  • 李子平 LI, Ziping
  • 万文坚 WAN, Wenjian
  • 曹俊诚 CAO, Juncheng
Agents
  • 上海智信专利代理有限公司 SHANGHAI ZHI XIN PATENT AGENT LTD.
Priority Data
201910350476.028.04.2019CN
Publication Language Chinese (ZH)
Filing Language Chinese (ZH)
Designated States
Title
(EN) TERAHERTZ SPECTRUM MEASUREMENT SYSTEM AND METHOD FOR ANALYZING TERAHERTZ SPECTRUM OF SUBSTANCE
(FR) SYSTÈME DE MESURE DE SPECTRE TÉRAHERTZ ET PROCÉDÉ D'ANALYSE DE SPECTRE TÉRAHERTZ DE SUBSTANCE
(ZH) 太赫兹光谱测量系统及分析物质的太赫兹光谱的方法
Abstract
(EN)
A terahertz spectrum measurement system and a method for analyzing a terahertz spectrum of a substance. The terahertz spectrum measurement system comprises: two terahertz quantum cascade lasers (1), emission ports of which face each other; and a vacuum hood provided between the emission ports of the two terahertz quantum cascade lasers (1). The terahertz spectrum measurement system and the method for analyzing a terahertz spectrum of a substance can retain the advantages of an on-chip dual frequency comb system, and further solve the problem that the terahertz spectrum of the substance cannot be directly measured by means of an on-chip dual frequency comb.
(FR)
L'invention concerne un système de mesure de spectre térahertz et un procédé d'analyse d'un spectre térahertz d'une substance. Le système de mesure de spectre térahertz comprend : deux lasers à cascade quantique térahertz (1), dont les ports d'émission se font face ; et une cloche à vide disposée entre les orifices d'émission des deux lasers à cascade quantique térahertz (1). Le système de mesure de spectre térahertz et le procédé d'analyse d'un spectre térahertz d'une substance permettent de conserver les avantages d'un système de peigne double fréquence sur puce, et de résoudre le problème selon lequel il est impossible de mesurer le spectre térahertz de la substance directement au moyen d'un peigne double fréquence sur puce.
(ZH)
一种太赫兹光谱测量系统及分析物质的太赫兹光谱的方法,其中太赫兹光谱测量系统包括:两个太赫兹量子级联激光器(1),出射口相对设置;真空罩,设置于两个太赫兹量子级联激光器(1)的出射口之间。太赫兹光谱测量系统及分析物质的太赫兹光谱的方法能够在保留片上双频梳系统的优点下,解决了片上双频梳无法直接测量物质太赫兹谱的缺点。
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