Minimum documentation searched (classification system followed by classification symbols):
Documentation searched other than minimum documentation to the extent that such documents are included in the fields searched:
Electronic data base consulted during the international search (name of data base and, where practicable, search terms used):
CNPAT,WPI,EPODOC,CNKI: JUSHU TECHNOLOGY,FOCUS EBEAM,scan+,electron+, microscope,composite,combin+,magnetic,lens,electric,focus,back,scatter,Xray,BSE,EDS,WDS,EDX,sample,specimen,annular+,ring,electrode