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1. WO2020220081 - THIN FILM X-RAY DIFFRACTION SAMPLE CELL DEVICE AND METHOD

Note: Text based on automatic Optical Character Recognition processes. Please use the PDF version for legal matters

[ EN ]

Claims:

1. A thin film X-ray diffraction sample cell device comprising:

a body having a raised sample holder;

first and second probe tips located adjacent to the sample holder; and

first and second translation stages each operable to move one of said first and second probe tips relative to three generally perpendicular axes.

2. The thin film X-ray diffraction sample cell device of claim 1, wherein each of the probe tips is connected to an electric power supply.

3. The thin film X-ray diffraction sample cell device of either of the preceding claims further comprising a cover configured to enclose the raised sample holder.

4. The thin film X-ray diffraction sample cell device of claim 3, wherein the cover includes a partially spherical shield and upper and lower metallic annular members which clamp a circumferential flange of the cover in a rigid section, the rigid section being seated in an annular channel formed on an upper portion of the body.

5. The thin film X-ray diffraction sample cell device of any one of the preceding claims, wherein the raised sample holder is coupled to a heating element configured to increase the temperature of the raised sample holder.

6. The thin film X-ray diffraction sample cell device of claim 5, wherein a thermally insulated member is located beneath the heating element.

7. The thin film X-ray diffraction sample cell device of claim 6, further comprising a fan located in the body, within a heat sink.

8. The thin film X-ray diffraction sample cell device of claim 7, wherein a thermally conductive bridge extends from beneath the thermally insulated member to the heat sink.

9. The thin film X-ray diffraction sample cell device of any one of the preceding claims, wherein each translation stage includes:

a first mechanism configured to move one of the probe tips in a first direction, generally parallel to an upper surface of the raised sample holder;

a second mechanism configured to move said probe tip in a second direction, perpendicular to the first direction and generally parallel to an upper surface of the raised sample holder; and

a vertical height adjustment mechanism configured to vertically raise or lower said probe tip relative to the raised sample holder.

10. The thin film X-ray diffraction sample cell device of claim 9, wherein the first and second mechanisms are each controlled by wheels.

11. The thin film X-ray diffraction sample cell device of any one of the preceding claims, wherein the sample holder is spring biased such that an upper surface of the sample holder remains stable when other components thermally expand.

12. The thin film X-ray diffraction sample cell device of any one of the preceding claims further comprising a clamp configured to apply a force to an upper surface of a sample to prevent the sample from unintentional movement during X-ray diffraction.

13. The thin film X-ray diffraction sample cell device of claim 12, wherein the clamp is spring biased.

14. The thin film X-ray diffraction sample cell device of any one of the preceding claims, wherein an upper surface of the raised sample holder is located above an uppermost surface of the body.

15. The thin film X-ray diffraction sample cell device of claim 2, wherein the probe tips are in electric connection with a printed circuit board located within the body.