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1. WO2020220081 - THIN FILM X-RAY DIFFRACTION SAMPLE CELL DEVICE AND METHOD

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Publication Number WO/2020/220081
Publication Date 05.11.2020
International Application No. PCT/AU2020/050425
International Filing Date 30.04.2020
IPC
G01N 23/20025 2018.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
20025Sample holders or supports therefor
G01N 23/20033 2018.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
20025Sample holders or supports therefor
20033provided with temperature control or heating means
G01N 23/201 2018.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
201Measuring small-angle scattering, e.g. small angle X-ray scattering
G01N 23/203 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
203Measuring back scattering
G01N 23/207 2018.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
207Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
G01N 27/60 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
60by investigating electrostatic variables
CPC
G01N 2033/0096
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
33Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
0096testing material properties on thin layers or coatings
G01N 2223/05
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
05by diffraction, scatter or reflection
G01N 23/20033
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
20025Sample holders or supports therefor
20033provided with temperature control or heating means
Applicants
  • CRITUS PTY LTD [AU]/[AU]
Inventors
  • DANIELS, John
Agents
  • COTTERS PATENT & TRADE MARK ATTORNEYS
Priority Data
201990150402.05.2019AU
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) THIN FILM X-RAY DIFFRACTION SAMPLE CELL DEVICE AND METHOD
(FR) DISPOSITIF ET PROCÉDÉ DE CELLULE D'ÉCHANTILLON À DIFFRACTION PAR RAYONS X SUR COUCHE MINCE
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Abstract
(EN)
A thin film X-ray diffraction sample cell device (100) comprises a body (110) having a raised sample holder (210). The device (100) includes first and second probe tips (300, 310) located adjacent to the sample holder (210) and first and second translation stages (305, 315) each operable to move one of said first and second probe tips (300, 310) relative to three generally perpendicular axes. The first and second probe tips (300, 310) are provided to apply an electric field to a sample while x-ray diffraction is carried out on the sample.
(FR)
L'invention concerne un dispositif de cellule d'échantillon à diffraction par rayons X sur couche mince (100) comprenant un corps (110) présentant un porte-échantillon surélevé (210). Le dispositif (100) comprend des première et seconde pointes de sonde (300, 310) adjacentes au porte-échantillon (210) et des premier et second étages de translation (305, 315) pouvant chacun fonctionner pour déplacer l'une desdites première et seconde pointes de sonde (300, 310) par rapport à trois axes généralement perpendiculaires. Les première et seconde pointes de sonde (300, 310) sont prévues pour appliquer un champ électrique à un échantillon tandis que la diffraction par rayons X est effectuée sur l'échantillon.
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