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1. WO2020201565 - X-RAY BEAM SHAPING APPARATUS AND METHOD

Publication Number WO/2020/201565
Publication Date 08.10.2020
International Application No. PCT/EP2020/059683
International Filing Date 03.04.2020
IPC
G01N 23/20008 2018.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
G21K 1/02 2006.01
GPHYSICS
21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
1Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
02using diaphragms, collimators
CPC
G01N 2223/056
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
05by diffraction, scatter or reflection
056diffraction
G01N 2223/3306
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
30Accessories, mechanical or electrical features
33scanning, i.e. relative motion for measurement of successive object-parts
3306object rotates
G01N 2223/607
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
60Specific applications or type of materials
607strain
G01N 23/20008
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
G21K 1/046
GPHYSICS
21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
1Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
02using diaphragms, collimators
04using variable diaphragms, shutters, choppers
046varying the contour of the field, e.g. multileaf collimators
Applicants
  • MALVERN PANALYTICAL B.V. [NL]/[NL]
Inventors
  • GATESHKI, Milen
  • KHARCHENKO, Alexander
  • BECKERS, Detlef
  • NORBERG, Nicholas
Agents
  • ELKINGTON AND FIFE LLP
Priority Data
19167406.804.04.2019EP
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) X-RAY BEAM SHAPING APPARATUS AND METHOD
(FR) APPAREIL ET PROCÉDÉ DE MISE EN FORME DE FAISCEAU DE RAYONS X
Abstract
(EN)
A beam shaping apparatus (10) for use in an X-ray analysis device (40). The beam shaping apparatus processes an input beam (32) from an X-ray beam source (20), and generates an output beam (34) with an output beam shape for irradiating a sample (112) held by a sample holder (22) of the X-ray analysis device. Movement of the output beam shape is controlled in dependence upon a varying tilt angle (χ) of the sample (112), this defined by a tilt position of the sample holder (22).
(FR)
L'invention concerne un appareil de mise en forme de faisceau (10) destiné à être utilisé dans un dispositif d'analyse de rayons X (40). L'appareil de mise en forme de faisceau traite un faisceau d'entrée (32) à partir d'une source de faisceau de rayons X (20), et génère un faisceau de sortie (34) présentant une forme de faisceau de sortie permettant d'irradier un échantillon (112) maintenu par un porte-échantillon (22) du dispositif d'analyse de rayons X. Le mouvement de la forme du faisceau de sortie est commandé en fonction d'un angle d'inclinaison variable (χ) de l'échantillon (112), défini par une position d'inclinaison du porte-échantillon (22).
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