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1. WO2020199540 - ARRAY SUBSTRATE AND TEST METHOD, MANUFACTURING METHOD AND TEST APPARATUS THEREFOR, AND DISPLAY PANEL MANUFACTURING METHOD

Publication Number WO/2020/199540
Publication Date 08.10.2020
International Application No. PCT/CN2019/108643
International Filing Date 27.09.2019
IPC
H01L 27/32 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
28including components using organic materials as the active part, or using a combination of organic materials with other materials as the active part
32with components specially adapted for light emission, e.g. flat-panel displays using organic light-emitting diodes
G01R 31/28 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
G09G 3/3208 2016.01
GPHYSICS
09EDUCATING; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
3Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
20for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix
22using controlled light sources
30using electroluminescent panels
32semiconductive, e.g. using light-emitting diodes
3208organic, e.g. using organic light-emitting diodes
Applicants
  • 云谷(固安)科技有限公司 YUNGU (GU'AN) TECHNOLOGY CO., LTD. [CN]/[CN]
Inventors
  • 白国晓 BAI, Guoxiao
  • 关江兵 GUAN, Jiangbing
  • 谢乐 XIE, Le
Agents
  • 北京华进京联知识产权代理有限公司 ACIP LAW OFFICES
Priority Data
201910252458.929.03.2019CN
Publication Language Chinese (ZH)
Filing Language Chinese (ZH)
Designated States
Title
(EN) ARRAY SUBSTRATE AND TEST METHOD, MANUFACTURING METHOD AND TEST APPARATUS THEREFOR, AND DISPLAY PANEL MANUFACTURING METHOD
(FR) SUBSTRAT DE RÉSEAU ET PROCÉDÉ DE TEST, PROCÉDÉ DE FABRICATION ET APPAREIL DE TEST ASSOCIÉ ET PROCÉDÉ DE FABRICATION DE PANNEAU D'AFFICHAGE
(ZH) 阵列基板及其测试方法、制造方法和测试装置以及显示面板制造方法
Abstract
(EN)
An array substrate (10) and a test method, a manufacturing method and a test apparatus therefor, and a display panel (100) manufacturing method. The array substrate (10) comprises a substrate (11), several pixel circuits (12) located on the substrate (11), and several test patterns (A) corresponding to the several pixel circuits (12), wherein the pixel circuit (12) comprises a driving unit (121), and the test pattern (A) is electrically connected to the driving unit (121), and the test pattern (A) is used for acquiring a test signal (A) output by the driving unit (121). The test signal (A) is acquired by means of the test pattern (A) provided on the array substrate (10), and the test signal (A) can be used for detecting whether the pixel circuit (12) contains a defect, such that the detection process is simple and convenient.
(FR)
La présente invention concerne un substrat de réseau (10) et un procédé de test, un procédé de fabrication et un appareil de test associé et un procédé de fabrication de panneau d'affichage (100). Le substrat de réseau (10) comprend un substrat (11), plusieurs circuits de pixels (12) situés sur le substrat (11) et plusieurs motifs de test (A) correspondant aux plusieurs circuits de pixels (12), le circuit de pixels (12) comprenant une unité d'entraînement (121) et le motif de test (A) est électriquement connecté à l'unité d'entraînement (121) et le motif de test (A) est utilisé pour acquérir un signal de test (A) délivré par l'unité d'entraînement (121). Le signal de test (A) est acquis au moyen du motif de test (A) disposé sur le substrat de réseau (10) et le signal de test (A) peut être utilisé pour détecter si le circuit de pixel (12) contient un défaut, de telle sorte que le processus de détection est simple et pratique.
(ZH)
一种阵列基板(10)及其测试方法、制造方法和测试装置以及显示面板(100)制造方法,阵列基板(10)包括基板(11)、位于基板(11)上的若干像素电路(12)及对应若干像素电路(12)的若干测试图案(A),像素电路(12)包括驱动单元(121),测试图案(A)电连接至驱动单元(121),测试图案(A)用于获取驱动单元(121)输出的测试信号(A)。通过设置于阵列基板(10)上的测试图案(A)来获取测试信号(A),测试信号(A)可用于检测像素电路(12)是否存在缺陷,检测过程简单便捷。
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