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1. WO2020198934 - SEMICONDUCTOR X-RAY DETECTOR


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INTERNATIONAL SEARCH REPORT (ISR)
Part 1:  1  2  3  4  5  6          Part 2:  A  B  C  D  E 
International application No. Applicant's or agent's file reference
PCT/CN2019/080407 XV0095PCT01
International filing date (day/month/year) (Earliest) Priority Date (day/month/year)
29 March 2019
Applicant
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
FOR FURTHER ACTION: See Form PCT/ISA/220 as well as, where applicable, item 5 below.
This international search report has been prepared by this International Searching Authority and is transmitted to the applicant according to Article 18. A copy is being transmitted to the International Bureau.
It is also accompanied by a copy of each prior art document cited in this report.
1. Basis of the report
a. With regard to the language, the international search was carried out on the basis of:
the international application in the language in which it was filed.
a translation of the international application into                                          which is the language of a translation furnished for the purposes of international search (Rules 12.3(a) and 23.1(b)).
b.
This international search report has been established taking into account the rectification of an obvious mistake authorized by or notified to this Authority under Rule 91 (Rule 43.6bis(a)).
c.
With regard to any nucleotide and/or amino acid sequence disclosed in the international application, the international search was carried out on the basis of a sequence listing:
2. Certain claims were found unsearchable
3. Unity of invention is lacking
4. Title of the invention
The text is approved as submitted by the applicant.
The text has been established by this Authority to read as follows:
5. Abstract
The text is approved as submitted by the applicant.
The text has been established, according to Rule 38.2, by this Authority as it appears in Box No. IV. The applicant may, within one month from the date of mailing of this international search report, submit comments to this Authority.

A semiconductor X-ray detector(100), comprising an X-ray absorption layer(110) comprising an electrode, an electronics layer(120) and a wall(130) sealing a space among electrical connections(131) between the X-ray absorption layer(110) and the electronics layer(120). The electronics layer(120) comprises: a first and second voltage comparators(301,302) configured to compare a voltage of an electrode to a first and second thresholds(V1,V2) respectively; a counter(320) configured to register a number of X-ray photons absorbed by the X-ray absorption layer(110); and a controller(310) configured to: start a time delay(TD1,TD2) from a time at which an absolute value of the voltage equals or exceeds an absolute value of the first threshold(V1); activate the second voltage comparator(302) during the time delay(TD1,TD2); cause the number registered by the counter(320) to increase by one, if, during the time delay(TD1,TD2), an absolute value of the voltage equals or exceeds an absolute value of the second threshold(V2).


6. Drawings
a.
The figure of the drawings to be published with the abstract is Figure No.     1D    
as suggested by the applicant.
as selected by this Authority, because the applicant failed to suggest a figure.
as selected by this Authority, because this figure better characterizes the invention.
b.
none of the figures is to be published with the abstract.

A. CLASSIFICATION OF SUBJECT MATTER

According to International Patent Classification (IPC) or to both national classification and IPC

B. FIELDS SEARCHED

Minimum documentation searched (classification system followed by classification symbols):
     G01T1/-; ; G01N23/-
Documentation searched other than minimum documentation to the extent that such documents are included in the fields searched:
Electronic data base consulted during the international search (name of data base and, where practicable, search terms used):
CNPAT,CNKI,WPI,EPODOC:SHENZHEN XPECTVISION,radiat+,X w ray,detect+,voltage, energy,comparator,threshold,count+,number,voltmeter,electric+,wire,connect+,pin,wall,avoid,prevent+,contamina+

C. DOCUMENTS CONSIDERED TO BE RELEVANT

Category* Citation of document, with indication, where appropriate, of the relevant passages Relevant to claim No.
(1)
Y
CN 108271415 A (SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.) 10 July 2018 (2018-07-10)
1-31
claims 1-37, description, paragraphs [0063]-[0103], figures 1-18
(2)
Y
US 6392217 B1 (SHARP K.K.) 21 May 2002 (2002-05-21)
1-31
description, column 16, line 55 to column 17, line 30, figure 7
(3)
A
CN 107533146 A (SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.) 02 January 2018 (2018-01-02)
1-31
the whole document
(4)
A
CN 102135626 A (SIEMENS AG.) 27 July 2011 (2011-07-27)
1-31
the whole document
(5)
A
CN 109346488 A (UNIV. SUN YAT SEN) 15 February 2019 (2019-02-15)
1-31
the whole document
(6)
A
US 8053722 B1 (KOTURA, INC.) 08 November 2011 (2011-11-08)
1-31
the whole document
*
Special categories of cited documents:
"A"
document defining the general state of the art which is not considered to be of particular relevance
"D"
document cited by the applicant in the international application
"E"
earlier application or patent but published on or after the international filing date
"L"
document which may throw doubts on priority claim(s) or which is cited to establish the publication date of another citation or other special reason (as specified)
"O"
document referring to an oral disclosure, use, exhibition or other means
"P"
document published prior to the international filing date but later than the priority date claimed
"T"
later document published after the international filing date or priority date and not in conflict with the application but cited to understand the principle or theory underlying the invention
"X"
document of particular relevance; the claimed invention cannot be considered novel or cannot be considered to involve an inventive step when the document is taken alone
"Y"
document of particular relevance; the claimed invention cannot be considered to involve an inventive step when the document is combined with one or more other such documents, such combination being obvious to a person skilled in the art
"&"
document member of the same patent family

D. INFORMATION ON PATENT FAMILY MEMBERS

Patent document cited in search report Publication date
(day/month/year)
Patent family member(s) Publication date
(day/month/year)
CN 108271415 A
10 July 2018
US 2018017685 A1
JP 6385591 B2
US 2018224563 A1
KR 101941899 B1
WO 2016161544 A1
CN 108271415 B
JP 2018511809 A
KR 20170140175 A
US 10061038 B2
TW 201640142 A
EP 3281039 A1
18 January 2018
05 September 2018
09 August 2018
24 January 2019
13 October 2016
05 March 2019
26 April 2018
20 December 2017
28 August 2018
16 November 2016
14 February 2018
US 6392217 B1
21 May 2002
JP 2000156487 A
06 June 2000
CN 107533146 A
02 January 2018
WO 2016161542 A1
JP 2018512596 A
KR 101941898 B1
US 10007009 B2
TW 201643468 A
CN 107533146 B
TW I632391 B
KR 20170141196 A
EP 3281040 A1
US 2018017686 A1
US 2018156927 A1
JP 6554554 B2
13 October 2016
17 May 2018
24 January 2019
26 June 2018
16 December 2016
18 June 2019
11 August 2018
22 December 2017
14 February 2018
18 January 2018
07 June 2018
31 July 2019
CN 102135626 A
27 July 2011
DE 102009055807 B4
DE 102009055807 A1
US 2011121191 A1
CN 102135626 B
US 8450695 B2
24 November 2016
09 June 2011
26 May 2011
04 June 2014
28 May 2013
CN 109346488 A
15 February 2019
None
US 8053722 B1
08 November 2011
None
Name and mailing address of the ISA/:
National Intellectual Property Administration, PRC
6, Xitucheng Rd., Jimen Bridge, Haidian District, Beijing 100088
China
Facsimile No. (86-10)62019451
Date of the actual completion of the international search:
18 December 2019
Date of mailing of the international search report:
30 December 2019
Authorized officer:
XU,Jindan
Telephone No. 86-(10)-53962464
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