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1. WO2020194986 - TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

Publication Number WO/2020/194986
Publication Date 01.10.2020
International Application No. PCT/JP2020/000234
International Filing Date 08.01.2020
IPC
G01N 23/20016 2018.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
20016Goniometers
G01N 23/20025 2018.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
20025Sample holders or supports therefor
G01N 23/201 2018.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
201Measuring small-angle scattering, e.g. small angle X-ray scattering
Applicants
  • 株式会社リガク RIGAKU CORPORATION [JP]/[JP]
Inventors
  • 松嶋 直樹 MATSUSHIMA Naoki
  • 尾形 潔 OGATA Kiyoshi
  • 吉原 正 YOSHIHARA Sei
  • 伊藤 義泰 ITO Yoshiyasu
  • 表 和彦 OMOTE Kazuhiko
  • 本野 寛 MOTONO Hiroshi
  • 淺野 繁松 ASANOO Shigematsu
  • 洞田 克隆 HORADA Katsutaka
  • 安田 千水 YASUDA Sensui
Agents
  • 山本 寿武 YAMAMOTO Toshitake
Priority Data
2019-06511228.03.2019JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
(FR) DISPOSITIF DE DIFFUSION À PETIT ANGLE TRANSMISSIF
(JA) 透過型小角散乱装置
Abstract
(EN)
A transmissive small-angle scattering device according to the present invention is provided with a goniometer 10 including a rotary arm 11. The rotary arm 11 has an origin in a state of being vertically disposed and is rotatable around a θ-axis horizontally extending from the origin. In addition, this device has a vertical arrangement structure in which an X-ray radiation unit 20 is mounted on a lower end section of the rotary arm 11, and a two-dimensional X-ray detector 30 is mounted on an upper end section of the rotary arm 11.
(FR)
La présente invention concerne un dispositif de diffusion à petit angle transmissif comprenant un goniomètre (10) comprenant un bras rotatif (11). Le bras rotatif (11) présente une origine dans un état de disposition verticale et peut tourner autour d'un axe θ s'étendant horizontalement depuis l'origine. De plus, ledit dispositif possède une structure d'agencement vertical dans laquelle une unité de rayonnement de rayons X (20) est montée sur une section d'extrémité inférieure du bras rotatif (11), et un détecteur de rayons X bidimensionnel (30) est monté sur une section d'extrémité supérieure du bras rotatif (11).
(JA)
本発明の透過型小角散乱装置は、旋回アーム11を含むゴニオメータ10を備えている。旋回アーム11は、鉛直方向の配置状態を原点として、当該原点から水平方向に延びるθ軸周りに回動自在である。そして、旋回アーム11の下側端部にX線照射ユニット20を搭載するとともに、旋回アーム11の上側端部に二次元X線検出器30を搭載する、縦型の配置構造となっている。
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