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1. WO2020194827 - SAMPLE MEASUREMENT DEVICE, AND MEASUREMENT PARAMETER ANALYSIS METHOD

Publication Number WO/2020/194827
Publication Date 01.10.2020
International Application No. PCT/JP2019/041921
International Filing Date 25.10.2019
IPC
G01N 30/86 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
30Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography
02Column chromatography
86Signal analysis
G01N 30/30 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
30Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography
02Column chromatography
26Conditioning of the fluid carrier; Flow patterns
28Control of physical parameters of the fluid carrier
30of temperature
G01N 30/34 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
30Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography
02Column chromatography
26Conditioning of the fluid carrier; Flow patterns
28Control of physical parameters of the fluid carrier
34of fluid composition, e.g. gradient
G01N 35/00 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/-G01N33/148; Handling materials therefor
Applicants
  • 株式会社島津製作所 SHIMADZU CORPORATION [JP]/[JP]
Inventors
  • 渡辺 覚 WATANABE, Satoru
  • 野田 陽 NODA, Akira
Agents
  • 宮園 博一 MIYAZONO, Hirokazu
Priority Data
2019-05686625.03.2019JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) SAMPLE MEASUREMENT DEVICE, AND MEASUREMENT PARAMETER ANALYSIS METHOD
(FR) DISPOSITIF DE MESURE D'ÉCHANTILLON ET PROCÉDÉ D'ANALYSE DE PARAMÈTRE DE MESURE
(JA) 試料測定装置および測定パラメータ解析方法
Abstract
(EN)
This sample measurement device (100) includes a data processing unit (20), which is configured so as to: acquire, on the basis of measurement data (40), a distribution (42) of measurement quality indices corresponding to measurement conditions (30); and acquire a parameter degree-of-impact (45) with respect to the measurement quality indices by analyzing, for each parameter (31), the measurement quality indices distribution.
(FR)
Ce dispositif (100) de mesure d'échantillon comprend une unité (20) de traitement de données, qui est configurée de sorte à : acquérir, sur la base de données de mesure (40), une répartition (42) d'indices de qualité de mesure correspondant à des conditions de mesure (30) ; et acquérir un degré d'impact de paramètre (45) par rapport aux indices de qualité de mesure par l'analyse, pour chaque paramètre (31), de la répartition d'indices de qualité de mesure.
(JA)
この試料測定装置(100)のデータ処理部(20)は、測定データ(40)に基づいて、測定条件(30)に応じた測定品質指標(41)の分布(42)を取得し、測定品質指標の分布を個々のパラメータ(31)について解析することにより、測定品質指標に対するパラメータの影響度(45)を取得するように構成されている。
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