Processing

Please wait...

Settings

Settings

Goto Application

1. WO2020194165 - AN APPARATUS TO OPERATE A QUALITY CONTROL IN INDUSTRIAL PRODUCTION LINES, CORRESPONDING METHOD AND COMPUTER PROGRAM PRODUCT

Publication Number WO/2020/194165
Publication Date 01.10.2020
International Application No. PCT/IB2020/052687
International Filing Date 23.03.2020
IPC
G01N 23/223 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
22by measuring secondary emission from the material
223by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N 21/359 2014.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
35using infra-red light
359using near infra-red light
G01N 35/00 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/-G01N33/148; Handling materials therefor
CPC
G01N 21/359
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
35using infra-red light
359using near infra-red light
G01N 2223/071
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
07secondary emission
071combination of measurements, at least 1 secondary emission
G01N 2223/076
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
07secondary emission
076X-ray fluorescence
G01N 2223/3308
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
30Accessories, mechanical or electrical features
33scanning, i.e. relative motion for measurement of successive object-parts
3308object translates
G01N 2223/623
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
60Specific applications or type of materials
623plastics
G01N 2223/643
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
60Specific applications or type of materials
643object on conveyor
Applicants
  • DE.TEC.TOR S.R.L. [IT]/[IT]
Inventors
  • PITTA', Giuseppe
  • LA ROSA, Vanessa
Agents
  • CROVINI, Giorgio
Priority Data
10201900000467128.03.2019IT
Publication Language English (EN)
Filing Language Italian (IT)
Designated States
Title
(EN) AN APPARATUS TO OPERATE A QUALITY CONTROL IN INDUSTRIAL PRODUCTION LINES, CORRESPONDING METHOD AND COMPUTER PROGRAM PRODUCT
(FR) APPAREIL SERVANT À EFFECTUER UN CONTRÔLE DE QUALITÉ DANS DES LIGNES DE PRODUCTION INDUSTRIELLE, PROCÉDÉ CORRESPONDANT ET PRODUIT PROGRAMME D'ORDINATEUR
Abstract
(EN)
An apparatus (20) for carrying out a quality control on industrial production lines (10), comprising one or more apparatuses (30, 40, 50) for the measurement of properties of a product sample (C) of the aforesaid industrial production lines (10), which supply respective one or more measurement signals, the apparatus (20) comprising a processing module configured for processing the one or more measurement signals and obtaining properties of the product sample (C), the quality control being carried out as a function of said properties of the product sample (C), said one or more apparatuses (30, 40, 50) for the measurement of properties of a product sample (C) comprising : an x-ray fluorescence apparatus (30) that comprises an x-ray source (331), which emits a first x- ray beam (XB, XBC) towards the product sample (C) in a measurement environment, and a particle detector (335), which is configured for receiving a second x-ray beam (XBR) scattered by the product sample (C) and generating a first received signal supplied within the set of said respective one or more measurement signals. The apparatus (20) further comprises an optical- spectroscopy apparatus, preferably operating in the near infrared (40), which comprises a radiation source operating in the near infrared (NIR), which emits a first optleal-radiation beam towards a product sample (C), and an optical sensor for receiving a second optleal-radiation beam scattered by the product sample (C) and generating a second received signal supplied within the set of said respective one or more measurement signals.
(FR)
L'invention concerne un appareil (20) servant à effectuer un contrôle de qualité sur des lignes de production industrielles (10), comprenant un ou plusieurs appareils (30, 40, 50) pour la mesure des propriétés d'un échantillon de produit (C) des lignes de production industrielles (10) susmentionnées, qui émettent un ou plusieurs signaux de mesure respectifs, l'appareil (20) comprenant un module de traitement configuré pour traiter le ou les signaux de mesure et obtenir des propriétés de l'échantillon de produit (C), le contrôle de qualité étant réalisé en fonction desdites propriétés de l'échantillon de produit (C), ledit ou lesdits appareils (30, 40, 50) pour la mesure de propriétés d'un échantillon de produit (C) comprenant : un appareil à fluorescence x (30), qui comprend une source de rayons X (331) et qui émet un premier faisceau de rayons X (XB, XBC) vers l'échantillon de produit (C) dans un environnement de mesure, et un détecteur de particules (335), qui est configuré pour recevoir un second faisceau de rayons X (XBR) diffusé par l'échantillon de produit (C) et pour générer un premier signal reçu émis parmi l'ensemble desdits un ou plusieurs signaux de mesure respectifs. L'appareil comprend en outre un appareil de spectroscopie optique, fonctionnant de préférence dans l'infrarouge proche (40), qui comprend une source de rayonnement fonctionnant dans l'infrarouge proche (NIR) et qui émet un premier faisceau de rayonnement optique vers un échantillon de produit (C), et un capteur optique destiné à recevoir un second faisceau de rayonnement optique diffusé par l'échantillon de produit (C) et pour générer un second signal reçu émis parmi l'ensemble desdits un ou plusieurs signaux de mesure respectifs.
Latest bibliographic data on file with the International Bureau