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1. WO2020193780 - METHOD AND DEVICE FOR ESTIMATING THE AGEING OF AN ELECTRONIC COMPONENT

Publication Number WO/2020/193780
Publication Date 01.10.2020
International Application No. PCT/EP2020/058830
International Filing Date 27.03.2020
IPC
G01R 31/26 2020.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
26Testing of individual semiconductor devices
G01R 31/28 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
G01R 31/30 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
30Marginal testing, e.g. by varying supply voltage
CPC
G01R 31/2642
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
26Testing of individual semiconductor devices
2642Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
G01R 31/2849
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2832Specific tests of electronic circuits not provided for elsewhere
2836Fault-finding or characterising
2849Environmental or reliability testing, e.g. burn-in or validation tests
G01R 31/2874
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
2855Environmental, reliability or burn-in testing
2872related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
2874related to temperature
G01R 31/30
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
30Marginal testing, e.g. by varying supply voltage
Applicants
  • CONTINENTAL AUTOMOTIVE GMBH [DE]/[DE]
Inventors
  • SOULAS, Nicolas
  • BAVOIS, Thierry
Agents
  • FOURNIE, Gilles
Priority Data
FR190321328.03.2019FR
Publication Language French (FR)
Filing Language French (FR)
Designated States
Title
(EN) METHOD AND DEVICE FOR ESTIMATING THE AGEING OF AN ELECTRONIC COMPONENT
(FR) PROCEDE ET DISPOSITIF D'ESTIMATION DU VIEILLISSEMENT D'UN COMPOSANT ELECTRONIQUE
Abstract
(EN)
The invention relates to a method for estimating the ageing of an electronic component (1), characterised in that it comprises the following steps: - compiling a thermal specification (2) of the electronic component (1) in order to determine a reference lifespan, - determining a reference temperature quantity, - measuring the actual temperature of the electronic component (1) in operation, - determining an actual temperature quantity, - determining an operating time equivalent to the actual temperature, - transposing this equivalent operating time to the reference temperature in order to obtain a transposed operating time, and - totalling the transposed operating time in order to obtain a consumed lifespan that can be compared with the reference lifespan.
(FR)
Procédé d'estimation du vieillissement d'un composant électronique (1) caractérisé en ce qu'il comprend les étapes suivantes : - compilation d'une spécification thermique (2) du composant électronique (1) afin de déterminer une durée de vie de référence, - détermination d'une quantité de température de référence, - mesure de la température réelle du composant électronique (1) en fonctionnement, - détermination d'une quantité de température réelle, - détermination d'un temps de fonctionnement équivalent à la température réelle, - transposition de ce temps de fonctionnement équivalent à la température de référence pour obtenir un temps de fonctionnement transposé, - cumul des temps de fonctionnement transposés pour obtenir une durée de vie consommée, comparable à la durée de vie de référence.
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